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Method for growing GaN crystalline using lateral epitaxy growth

机译:利用横向外延生长来生长GaN晶体的方法

摘要

PURPOSE: A method is to selectively grow GaN single crystals to simplify the ELO fabrication process and thereby greatly reduce the processing time for the growth of GaN single crystals. CONSTITUTION: A method includes (a) directly forming a silicon oxide (SiO_2) pattern on a semiconductor substrate; (b) introducing the semiconductor substrate with the silicon oxide pattern formed thereon into a metal organic chemical vapor deposition reactor to grow a GaN cold buffer layer to a predetermined thickness at a first temperature; (c) raising the temperature of the reactor to a second temperature for heat treatment to move the GaN buffer layer formed on a silicon oxide strip to a region between the silicon oxide patterns and thereby form GaN single crystals only on a sapphire substrate exposed between the silicon oxide patterns; (d) selectively grow the GaN single crystals between the silicon oxide patterns such that the grown GaN single crystals are continuously grown laterally on the silicon oxide patterns to combine the silicon oxide patterns together; and (e) growing the GaN single crystal layer thick.
机译:目的:一种方法是选择性地生长GaN单晶,以简化ELO制造工艺,从而大大减少GaN单晶生长的处理时间。构成:一种方法包括:(a)在半导体衬底上直接形成氧化硅(SiO_2)图案; (b)将其上形成有氧化硅图案的半导体衬底引入金属有机化学气相沉积反应器中,以在第一温度下将GaN冷缓冲层生长至预定厚度; (c)将反应器的温度升高至第二温度以进行热处理,以将形成在氧化硅条上的GaN缓冲层移动到氧化硅图案之间的区域,从而仅在暴露于氧化硅条之间的蓝宝石衬底上形成GaN单晶。氧化硅图案; (d)在氧化硅图形之间选择性地生长GaN单晶,使得生长的GaN单晶在氧化硅图形上横向连续生长,从而将氧化硅图形组合在一起; (e)使GaN单晶层厚。

著录项

  • 公开/公告号KR100455277B1

    专利类型

  • 公开/公告日2004-11-06

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR19990004983

  • 发明设计人 한재용;

    申请日1999-02-12

  • 分类号C30B29/38;C30B25/00;

  • 国家 KR

  • 入库时间 2022-08-21 22:46:28

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