Metal oxide semiconductor gate circuit includes driver circuit carrying out test to prevent simultaneous conduction when applied voltage cannot be resisted

摘要

A number of gate-controlled switches is included, with a driver circuit connected to them. The driver circuit is configured to measure a characteristic of one or more of them. This ascertains whether the switch can resist a blocking voltage without conducting. The driver circuit automatically prevents simultaneous conduction of the gate controlled switch, when at least one of them is not in the position to resist renewed applied voltage, without conducting. An Independent claim is included for the corresponding method.