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Analysis arrangement for determining the direction of electron spin polarization in an imaging electron microscope has a polarization-sensitive scatter target
Analysis arrangement for determining the direction of electron spin polarization in an imaging electron microscope has a polarization-sensitive scatter target
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机译:在成像电子显微镜中用于确定电子自旋极化方向的分析装置具有极化敏感的散射目标
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摘要
Arrangement for determining electron spin polarization in imaging electron microscopes, which analyses the electron beam for its degree of spin polarization and the direction of the spin polarization vector. The arrangement includes a polarization-sensitive scatter target in the direct imaging beam path of the electron microscope.
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