Method for spatially resolved analyzing electron spin-polarization in optical path of e.g. parallel illustrating electron microscope, involves arranging filter in radiation path between lenses and detector in radiation direction

摘要

The method involves analyzing a lateral distribution of a spin-polarization degree of electrons in jet blasting (11a-11b) by a polarization-sensitive bedding target (1). The polarization-sensitive bedding target and an electron-optical beam guide arrangement are provided with electron-optical lenses (3, 4). The electron-optical beam guide arrangement is arranged at an outlet (9) in parallel running beams an opposite-field energy filter (5) is arranged in a radiation path between one of the lenses and a detector (6) e.g. electron detector, in a radiation direction. An independent claim is also included for an arrangement for spatially resolved analyzing electron spin polarization in an optical path of a parallel illustrating electron microscope or behind a beam exit of an electron spectrometer.