首页> 外国专利> Recycling donor wafer after having taken at least one useful layer of material chosen from semiconductor materials, comprises removal of substance on side of donor wafer where taking-off took place by employing mechanical means

Recycling donor wafer after having taken at least one useful layer of material chosen from semiconductor materials, comprises removal of substance on side of donor wafer where taking-off took place by employing mechanical means

机译:回收至少一层选自半导体材料的有用材料后,回收供体晶圆,包括通过机械手段去除供体晶圆一侧的物质

摘要

Recycling a donor wafer after having taken at least one useful layer of material chosen from semiconductor materials, comprises removal of substance on side of wafer where taking-off took place. Substance is removed by mechanical means so that, after removal, at least part of buffer structure remains, this part capable of being reused as buffer structure during subsequent useful layer taking-off. Recycling a donor wafer (10) after having taken at least one useful layer of a material chosen from semiconductor materials, the donor wafer comprising successively a substrate (1), a buffer structure and, before taking-off, a useful layer, comprises removal of substance on the side of the donor wafer where the taking-off took place. The removal of substance comprises employing mechanical means so that, after removal of substance, at least part of the buffer structure remains, this at least part of the buffer structure capable of being reused as a buffer structure during a subsequent useful layer taking-off. Independent claims are also included for the following: (a) production of a donor wafer intended to provide a useful layer by taking-off and capable of being recycled after taking-off, comprising: formation of a first part of a buffer structure on a substrate; formation of a protective layer on the first part of the buffer structure, in a material chosen from crystalline materials; formation on the protective layer of the second part of the buffer structure, such that it has a lattice parameter in the vicinity of the protective layer the same as that of the first part of the buffer structure in the vicinity of the protective layer; (b) taking off a useful layer on a donor wafer to be transferred to a receiving substrate, comprising: bonding the donor wafer to the receiving substrate; detaching a useful layer bonded to the receiving substrate from the donor wafer; and recycling the donor wafer complying with the method of recycling; (c) application of the method of cyclically taking-off for producing a structure comprising the receiving substrate and the useful layer, the useful layer comprising at least one of the following materials: silicon-germanium (SiGe), strained Si, Ge, an alloy belonging to the IU-V family, the composition of which is respectively chosen from the possible (aluminum, gallium, indium)-(nitrogen-phosphorus-arsenic) (Al,Ga,In)-(N,P,As) combinations; and (d) a donor wafer having supplied a useful layer by taking-off and capable of being recycled complying with the method of recycling, comprising a substrate and a remaining part of the buffer structure.
机译:在已经从半导体材料中选择了至少一个有用的材料层之后,回收施主晶片包括去除在发生晶片的晶片侧上的物质。通过机械方式除去物质,使得在除去之后,至少保留缓冲结构的一部分,该部分能够在随后的有用层脱除期间作为缓冲结构重复使用。在获取了选自半导体材料的材料的至少一个有用层之后,回收供体晶片(10),该供体晶片依次包括衬底(1),缓冲结构以及在移除之前的有用层包括去除物质在供体晶圆上发生剥离的那一面。物质的去除包括采用机械手段,使得在去除物质之后,至少部分缓冲结构保留,该缓冲结构的至少一部分能够在随后的有用层脱除期间重新用作缓冲结构。还包括以下方面的独立权利要求:(a)供体晶片的生产,该供体晶片旨在通过脱模提供有用的层,并且能够在脱模后回收,包括:在硅上形成缓冲结构的第一部分。基质;在选自晶体材料的材料中的缓冲结构的第一部分上形成保护层;形成在缓冲结构的第二部分的保护层上,使得其在保护层附近的晶格参数与在保护层附近的缓冲结构的第一部分的晶格参数相同; (b)去除施主晶片上的有用层,以将其转移到接收基板上,包括:将施主晶片结合到接收基板上;从施主晶片上分离粘合到接收衬底上的有用层;并按照回收方法回收供体晶片; (c)应用循环起飞的方法来制造包括接收衬底和有用层的结构,该有用层包括以下至少一种材料:硅锗(SiGe),应变Si,Ge,属于IU-V族的合金,其成分分别选自可能的(铝,镓,铟)-(氮-磷-砷)(Al,Ga,In)-(N,P,As)组合; (d)施主晶片,其通过脱模而提供了有用的层,并且能够根据再循环方法进行再循环,该施主晶片包括基板和缓冲结构的其余部分。

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