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OPTICAL ANALYSIS APPARATUS AND AUTOMATIC ANALYSIS APPARATUS USING SAME

机译:使用相同的光学分析仪器和自动分析仪器

摘要

PROBLEM TO BE SOLVED: To provide an optical analysis apparatus capable of outputting a stable and reliable analysis result, even in the case an actuator expresses an imperfect shield state, by recognizing the imperfect shield state and masking analysis results obtained in unstable measurement states, and to provide an automatic analysis apparatus using the optical analysis apparatus.;SOLUTION: The automatic analysis apparatus has a function by which light intensity values of a light emitting diode mounted in a measuring means between before and after conducting a specimen measurement are monitored just before and after measuring a specimen, and a normal switching condition of the actuator is accurately recognized, and outputting a data set of the analysis result which is deviates from an expected value and may be obtained in the imperfect shield state, is prevented.;COPYRIGHT: (C)2005,JPO&NCIPI
机译:解决的问题:提供一种光学分析装置,即使在致动器表现出不完美的屏蔽状态的情况下,也能够通过识别不完美的屏蔽状态和在不稳定的测量状态下获得的掩蔽分析结果来输出稳定且可靠的分析结果,以及提供一种使用光学分析装置的自动分析装置。解决方案:自动分析装置具有一项功能,通过该功能,可以在进行样品测量之前和之后监测安装在测量装置中的发光二极管的光强度值。测量样本后,可以准确识别执行器的正常开关状态,并防止输出偏离预期值且在不完全屏蔽状态下可能获得的分析结果数据集。; COPYRIGHT:( C)2005,日本特许厅

著录项

  • 公开/公告号JP2005164507A

    专利类型

  • 公开/公告日2005-06-23

    原文格式PDF

  • 申请/专利权人 HITACHI HIGH-TECHNOLOGIES CORP;

    申请/专利号JP20030406676

  • 发明设计人 WATARI SHIGENORI;ISHIZAWA MASAHITO;

    申请日2003-12-05

  • 分类号G01N21/01;G01N21/78;G01N35/00;

  • 国家 JP

  • 入库时间 2022-08-21 22:34:56

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