首页> 外国专利> POSITION COORDINATE MEASUREMENT METHOD, OPTICAL CHARACTERISTIC MEASUREMENT METHOD, OPTICAL CHARACTERISTIC MEASURING APPARATUS, METHOD FOR MANUFACTURING PROJECTION OPTICAL SYSTEM, PROJECTION OPTICAL SYSTEM, AND PROJECTION ALIGNER

POSITION COORDINATE MEASUREMENT METHOD, OPTICAL CHARACTERISTIC MEASUREMENT METHOD, OPTICAL CHARACTERISTIC MEASURING APPARATUS, METHOD FOR MANUFACTURING PROJECTION OPTICAL SYSTEM, PROJECTION OPTICAL SYSTEM, AND PROJECTION ALIGNER

机译:位置坐标测量方法,光学特性测量方法,光学特性测量设备,制造投影光学系统的方法,投影光学系统和投影警报器

摘要

PROBLEM TO BE SOLVED: To provide a position coordinates measurement method for measuring position coordinates precisely even if an optical system is rotated and moved when measuring the position coordinates of the optical system.;SOLUTION: The position coordinate measurement method for measuring position coordinates in the optical system having an intermediate imaging plane comprises a process for acquiring the image of a mark inserted into the intermediate imaging plane, and a process for calculating the position coordinates of the optical system on the basis of the image of the mark.;COPYRIGHT: (C)2005,JPO&NCIPI
机译:解决的问题:提供一种即使在测量光学系统的位置坐标时光学系统旋转和移动也能精确测量位置坐标的位置坐标测量方法;解决方案:用于测量光学系统中位置坐标的位置坐标测量方法具有中间成像平面的光学系统包括:获取插入到中间成像平面中的标记的图像的过程;以及基于标记的图像计算光学系统的位置坐标的过程。 C)2005,日本特许厅

著录项

  • 公开/公告号JP2005030777A

    专利类型

  • 公开/公告日2005-02-03

    原文格式PDF

  • 申请/专利权人 NIKON CORP;

    申请/专利号JP20030192829

  • 发明设计人 ISHII MIKIHIKO;

    申请日2003-07-07

  • 分类号G01B11/00;G01M11/02;H01L21/027;

  • 国家 JP

  • 入库时间 2022-08-21 22:30:43

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