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Layout and design of phase-shift photolithography dichroic mask

机译:相移光刻二向色掩模的布局与设计

摘要

How to define the layout of all phases to define the material layer of the present invention relates an integrated circuit is disclosed. This method can be used to refine the phase shifter define to define a layer substantially with the phase Shifuteingu, and placement. Through [MEANS FOR SOLVING PROBLEMS] process, the opening of the alternate, a computer-readable definition of dark field phase shift mask, and a computer-readable definition of complementary mask is generated. The mask is used to produce the material layer of the integrated circuit and can be produced from the definition. This facilitates the mask manufacturing at the same time, the separation between the cutting, is designed to maximize the amount of each of the features defined by the phase mask Shifuteingu or phase shifter. It is used to select the phase assignment of higher quality by reducing the phase collision cost function describes the relative quality of the phase assignments.
机译:公开了如何定义所有相的布局以定义材料层,本发明涉及一种集成电路。该方法可用于完善移相器的定义,以定义一个基本上由相位Shifuteingu和位置组成的层。通过[解决问题的手段]过程,生成了替代的打开,暗场相移掩模的计算机可读定义以及互补掩模的计算机可读定义。掩模用于产生集成电路的材料层,并且可以根据定义产生。这有利于同时进行掩模制造,切割之间的间隔被设计为最大化由相掩模Shifuteingu或移相器定义的每个特征的数量。它通过减少相位冲突成本函数来选择较高质量的相位分配,该函数描述了相位分配的相对质量。

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