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ALIGNER AND METHOD OF MEASURING MUELLER MATRIX OF OPTICAL SYSTEM OF ALIGNER

机译:阿里格纳和阿里格纳光学系统的米勒矩阵的测量方法

摘要

PROBLEM TO BE SOLVED: To measure the Mueller matrix of an optical system included in an aligner, without disassembling the aligner.;SOLUTION: A first polarization conversion device 2 converts a light flux from an optical apparatus 1 to a plurality of polarized lights orthogonal to each other on the Poincare sphere sequentially, and outputs them. These polarized lights are made to pass through a projecting optical system 6 or the like, and an optical detection part 8 detects the light intensity. A plurality of the light intensities are detected, by setting a linear polarizer in a second polarization conversion device 7 to 45×n° ( n Is an integer.) in its azimuthal angle, and switching the insertion and removal of a 1/4 wavelength plate. Stokes parameters for the polarized lights, after the conversion by the projecting optical system 6 or the like are calculated on the basis of resulting data of the plurality of the light intensities, and further the Mueller matrix (M) of the projecting optical system 6 is calculated.;COPYRIGHT: (C)2005,JPO&NCIPI
机译:解决的问题:在不拆卸对准器的情况下,测量对准器中包括的光学系统的穆勒矩阵。解决方案:第一偏振转换装置2将来自光学设备1的光束转换为与偏振器正交的多个偏振光。在Poincare领域彼此按顺序排列并输出。使这些偏振光通过投射光学系统6等,并且光学检测部8检测光强度。通过将第二偏振转换装置7中的线性偏振器设置为45°×n°,可以检测多个光强度。 (n是整数。)的方位角,并切换1/4波长板的插入和移出。基于多个光强度的结果数据,在由投影光学系统6等进行转换之后,计算偏振光的斯托克斯参数,并且,投影光学系统6的穆勒矩阵(M)为: COPYRIGHT:(C)2005,JPO&NCIPI

著录项

  • 公开/公告号JP2005116732A

    专利类型

  • 公开/公告日2005-04-28

    原文格式PDF

  • 申请/专利权人 TOSHIBA CORP;

    申请/专利号JP20030348131

  • 发明设计人 NOMURA HIROSHI;

    申请日2003-10-07

  • 分类号H01L21/027;G02B5/30;G03F7/20;

  • 国家 JP

  • 入库时间 2022-08-21 22:28:57

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