Multiple function pattern generator and comparator having self-seeding test function

摘要

A multiple function pattern generator for a serializer/deserializer circuit located on an integrated circuit (IC), comprises a pattern generator in a communications channel, the pattern generator configured to develop a plurality of test patterns and configured to receive the output of the communications channel and user data based on pattern selection and user data, and a comparator configured to receive the output of the communication channel and the output of the pattern generator, where the pattern generator self seeds with the user data, and where the user data comprises a fixed length bit test pattern.