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Product defect analysis and resolution system

机译:产品缺陷分析与解决系统

摘要

A defect analysis and resolution (DAR) system analyzes product performance data stored by a firm. The DAR system may store data representing product performance as a plurality of data objects, each object having fields representing various product performance parameters. The system also may store a database representing expected product performance data across the same parameters. If the system monitors a statistically significant deviation between actual performance data and expected performance data, it may trigger a defect analysis process. The defect analysis process may exchange product performance data with systems of possibly other market participants involving the same product. An analysis may be performed on a larger set of data to determine likely causes of product defects and possible resolution. Resolution solutions may be stored in a database for further consideration by members of the firm.
机译:缺陷分析和解决方案(DAR)系统分析公司存储的产品性能数据。 DAR系统可以将表示产品性能的数据存储为多个数据对象,每个对象具有表示各种产品性能参数的字段。该系统还可以存储代表跨相同参数的预期产品性能数据的数据库。如果系统监视实际性能数据和预期性能数据之间的统计显着性差异,则可能会触发缺陷分析过程。缺陷分析过程可能与涉及同一产品的其他市场参与者的系统交换产品性能数据。可以对更大的一组数据执行分析,以确定产品缺陷的可能原因和可能的解决方案。解决方案可以存储在数据库中,以供公司成员进一步考虑。

著录项

  • 公开/公告号US2005027487A1

    专利类型

  • 公开/公告日2005-02-03

    原文格式PDF

  • 申请/专利权人 SUPRIYA IYER;

    申请/专利号US20040847324

  • 发明设计人 SUPRIYA IYER;

    申请日2004-05-18

  • 分类号G06F11/30;

  • 国家 US

  • 入库时间 2022-08-21 22:22:30

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