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On-chip and at-speed tester for testing and characterization of different types of memories
On-chip and at-speed tester for testing and characterization of different types of memories
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机译:片上和高速测试仪,用于测试和表征不同类型的存储器
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摘要
An on-chip and at-speed testerfor testing and characterization of different types of memories in an integrated circuit device, comprising a Centralized Flow Controller for automatically controlling the test operations for selected test programs, and Localized Signal Generators located inside each memory block and controlled by said Centralized Flow Controller for applying specified test patterns on the associated memory array.
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