首页> 外国专利> Scribe lane for gettering of contaminants on SOI wafers and gettering method

Scribe lane for gettering of contaminants on SOI wafers and gettering method

机译:用于在SOI晶片上吸收污染物的划线器和吸收方法

摘要

A method of manufacturing a semiconductor device on a silicon-on-insulator wafer including a silicon active layer having at least two die pads formed thereon, the at least two die pads separated by at least one scribe lane, including the steps of forming at least one cavity through the silicon active layer in the at least one scribe lane; forming at least one gettering plug in each said cavity, each said gettering plug comprising doped fill material containing a plurality of gettering sites; and subjecting the wafer to conditions to getter at least one impurity into the plurality of gettering sites. A silicon-on-insulator semiconductor wafer including a silicon active layer; a plurality of die pads formed in the silicon active layer; at least one scribe lane between and separating adjacent die pads; and at least one gettering plug in the at least one scribe lane, wherein the at least one gettering plug extends through the silicon active layer and the gettering plug comprises a doped fill material having a plurality of gettering sites.
机译:一种在绝缘体上硅晶片上制造半导体器件的方法,所述绝缘体上硅晶片包括在其上形成有至少两个管芯焊盘的硅有源层,所述至少两个管芯焊盘由至少一个划片道隔开,包括形成至少在至少一个划片道中穿过硅有源层的一个腔;在每个所述空腔中形成至少一个吸气塞,每个所述吸气塞包括包含多个吸气部位的掺杂填充材料;使晶片经受将至少一种杂质吸收到多个吸收位置的条件。绝缘体上硅半导体晶片,包括硅有源层;在硅有源层中形成的多个管芯焊盘;在相邻的管芯焊盘之间并且将其分开的至少一个划片道;至少一个划痕道中的至少一个吸气塞,其中所述至少一个吸气塞延伸穿过所述硅活性层,并且所述吸气塞包括具有多个吸气部位的掺杂填充材料。

著录项

  • 公开/公告号US6958264B1

    专利类型

  • 公开/公告日2005-10-25

    原文格式PDF

  • 申请/专利权人 MING-REN LIN;

    申请/专利号US20010824933

  • 发明设计人 MING-REN LIN;

    申请日2001-04-03

  • 分类号H01L21/335;H01L21/8232;

  • 国家 US

  • 入库时间 2022-08-21 22:20:44

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