Testing integrated circuits with fault dictionary

摘要

A method and apparatus for diagnosing resistive open defects in address decoders and, in particular memory address decoders. The method and apparatus accelerate the diagnosis process of detecting any resistive open defects that may occur during production, particularly where time-to market is a very important factor. Based on the disclosed invention, many actions for improving yield can be taken. In accordance with the invention, there is created a fault dictionary of resistive-open defects based on defect location, transistor types, terminal names and also the fault behavior. The dictionary enhances the diagnosing capabilities and also helps in differentiating between resistive bridge and resistive open defects.