首页> 外国专利> RETICLE LOADING APPARATUS WITH CONTAMINATION INSPECTING PART FOR CHECKING CONTAMINATION OF RETICLE SUPPORT BAR IN EXPOSURE EQUIPMENT

RETICLE LOADING APPARATUS WITH CONTAMINATION INSPECTING PART FOR CHECKING CONTAMINATION OF RETICLE SUPPORT BAR IN EXPOSURE EQUIPMENT

机译:带污染检查部件的光罩加载装置,用于检查曝光设备中的光罩支撑条的污染

摘要

Purpose: the graticule load apparatus in radiation device is arranged to reduce process failure since the loading of a contaminated graticule had previously checked the pollution of a reticle support item, uses the pollution for checking part. Construction: a graticule load apparatus includes a reticle stage, a graticule holding part, a driving link, and checks the pollution of part. Reticle stage (10) includes multiple reticle support items (12) for supporting a graticule. Graticule holding part (20) is for shifting graticule to reticle stage. Driving link (30) is connect with graticule holding part. Driving link is for mobile control graticule to reticle support item. Check that the pollution of part (40) is installed in the side of graticule holding part. It checks a contaminated state of the pollution of part for checking reticle support item, passes through the moving sweep support bars according to graticule holding part.
机译:目的:辐射装置中的刻度线加载设备被布置为减少过程失败,因为被污染的刻度线的加载先前已经检查了标线支持物的污染,使用该污染来检查零件。结构:标线装载装置包括标线片台,标线保持部件,驱动连杆,并检查部件的污染情况。掩模版台(10)包括多个用于支撑刻度线的掩模版支撑件(12)。刻度保持部分(20)用于将刻度移动到标线片阶段。驱动连杆(30)与刻度保持部连接。驱动链接是用于移动控制标线到标线支持项目。检查零件(40)的污染是否安装在刻度线固定零件的侧面。它检查用于检查掩模版支撑件的部件的污染状态,并根据刻度保持部件穿过移动的扫掠支撑杆。

著录项

  • 公开/公告号KR20040100110A

    专利类型

  • 公开/公告日2004-12-02

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20030032326

  • 发明设计人 KIM SANG DEOK;

    申请日2003-05-21

  • 分类号H01L21/027;

  • 国家 KR

  • 入库时间 2022-08-21 22:06:28

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