CIRCUIT FOR GENERATING REFERENCE VOLTAGE USING BYPASS IN SEMICONDUCTOR DEVICE, ESPECIALLY INCLUDING DECODER IN VOLTAGE GENERATION UNIT TO GENERATE REFERENCE VOLTAGE

摘要

PURPOSE: A circuit for generating reference voltage using a bypass in a semiconductor device is provided to use a test mode even after cutting a fuse by using a bypass, and to stabilize a reference voltage level by using resistors. CONSTITUTION: A circuit for generating reference voltage using a bypass in a semiconductor device comprises a reference voltage generating unit(300) for generating reference voltage(Vrc); an input unit for outputting a fuse test signal according to an outer test enable signal and an address signal during a test mode; a signal generating unit for being supplied working voltage via a fuse, for outputting a test signal according to the fuse test signal, and for being disabled by a fuse cutting; a bypass unit for generating the test signal according to the fuse test signal during disablement of the signal generating unit with the fuse cutting; an output unit for generating a control signal for adjusting the reference voltage level according to an output of the signal generating unit or the bypass unit; a level shift unit for controlling the operation of the bypass unit according to the outer test enable signal.