首页> 外国专利> WAFER TRANSFER APPARATUS TO PREVENT SENSITIVITY OF SENSOR FROM BEING DETERIORATED AND MORE PRECISELY DETECT WAFER WHEN WAFER PLACED IN SLOTS FORMED IN CASSETTE IS MAPPED

WAFER TRANSFER APPARATUS TO PREVENT SENSITIVITY OF SENSOR FROM BEING DETERIORATED AND MORE PRECISELY DETECT WAFER WHEN WAFER PLACED IN SLOTS FORMED IN CASSETTE IS MAPPED

机译:晶片传送装置,可防止在晶片盒中放置晶片的情况下,晶片变差并能更精确地检测晶片,从而防止传感器的灵敏度下降

摘要

Purpose: the susceptibility that a wafer transfer device is arranged to one sensor of prevention, which deteriorates and more accurately detects a chip, works as chip, it is arranged in the slot form in a box, be by a position install a sensor maps when, wherein various byproducts are not pierced on the wafer. Construction: a chip is placed on a placement part (140). The arm (150) and upward stretch out extended from placement part is included in a piece of sword (130). Sword is supported by a support sector. One driver part vertically shifts and rotates support sector. One detection part detects whether that chip is placed in each slot in a box, the first sensor (156) including being mounted on arm.
机译:目的:将晶片传送装置安装在一个防止传感器上,使其变质并更准确地检测芯片的敏感性,用作芯片,将其以狭槽的形式安装在盒子中,在安装位置由传感器映射,其中各种副产物没有刺穿在晶片上。结构:将芯片放置在放置部分(140)上。从放置部分延伸出的向上延伸的臂(150)包括在一把剑(130)中。剑由支持部门支持。一个驱动器部件垂直移动和旋转支撑扇区。一个检测部分检测该芯片是否放置在盒子的每个插槽中,第一传感器(156)包括安装在臂上。

著录项

  • 公开/公告号KR20050006425A

    专利类型

  • 公开/公告日2005-01-17

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20030046139

  • 发明设计人 AN SEOK HYUN;

    申请日2003-07-08

  • 分类号H01L21/68;

  • 国家 KR

  • 入库时间 2022-08-21 22:06:00

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