首页> 外国专利> WAFER SENSING APPARATUS OF A WAFER TRANSFER SYSTEM AND AN INTERLOCKING METHOD USING THE SAME, CAPABLE OF PREVENTING A WAFER FROM BEING DAMAGED BY A CROSS SLOT

WAFER SENSING APPARATUS OF A WAFER TRANSFER SYSTEM AND AN INTERLOCKING METHOD USING THE SAME, CAPABLE OF PREVENTING A WAFER FROM BEING DAMAGED BY A CROSS SLOT

机译:晶片传送系统的晶片检测装置和使用该装置的联锁方法,能够防止晶片被交叉槽损坏

摘要

PURPOSE: A wafer sensing apparatus of a wafer transfer system and an interlocking method using the same are provided to prevent the process accident by the misalignment of the wafer in advance by sensing the number and an alignment status of a wafer held by a retainer in a transfer stage.;CONSTITUTION: A sensor moving shaft(50) is located on surface a retainer fixing bar(24). The sensor moving shaft reciprocates according to the retainer fixing bar. The driving unit transfers the driving force to the sensor moving shaft. A wafer sensor(60) comprises a lighting-emitting area(61) and a photo diode(62). The wafer sensor transmits the sensitivity signal of the light.;COPYRIGHT KIPO 2010
机译:目的:提供一种晶片传送系统的晶片感测设备以及使用该晶片感测设备的联锁方法,以通过感测由保持器保持在晶片中的晶片的数量和对准状态来预先防止由于晶片未对准而引起的处理事故。组成:传感器移动轴(50)位于固定器固定杆(24)的表面上。传感器移动轴根据固定器固定杆往复运动。驱动单元将驱动力传递到传感器移动轴。晶片传感器(60)包括发光区域(61)和光电二极管(62)。晶圆传感器传输光的灵敏度信号。; COPYRIGHT KIPO 2010

著录项

  • 公开/公告号KR20100058869A

    专利类型

  • 公开/公告日2010-06-04

    原文格式PDF

  • 申请/专利权人 DONGBU HITEK CO. LTD.;

    申请/专利号KR20080117435

  • 发明设计人 YOON TAE HO;

    申请日2008-11-25

  • 分类号H01L21/677;H01L21/66;

  • 国家 KR

  • 入库时间 2022-08-21 18:32:38

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