首页> 外国专利> METHOD FOR FORMING DUAL METAL GATE WITH DIFFERENT WORK FUNCTIONS TO MAKE NMOS AND PMOS GATE ELECTRODES HAVE DIFFERENT WORK FUNCTIONS

METHOD FOR FORMING DUAL METAL GATE WITH DIFFERENT WORK FUNCTIONS TO MAKE NMOS AND PMOS GATE ELECTRODES HAVE DIFFERENT WORK FUNCTIONS

机译:形成具有不同工作功能的具有不同工作功能的双金属门的方法

摘要

Purpose: a kind of method is used to form the double-metal grid with different work functions and is arranged to manufacture NMOS (n- NMOS N-channel MOS Ns), and PMOS gate electrodes have different work functions by using two kinds of metals, tantalum and ruthenium. Construction: a gate insulating layer (110) is formed in a silicon substrate (100), has the regions PMOS and the regions NMOS, is isolated by an insulation oxide layer. After photoresist is formed in gate insulating layer, to carry out opening the top of gate insulating layer using a patterning process of a PMOS gate masks. A metal layer (120) with a high work content is formed in open gate insulating layer and photoresist. By removing photoresist, the metal layer of the high work content formed on photoresist is eliminated by a lift-off method to form a PMOS gate patterns. After photoresist is formed in substrate, there is PMOS gate patterns, a NMOS gate patterns are made of metal (130) with a low work function by same procedure, use a NMOS gate masks.
机译:目的:采用一种方法形成具有不同功函数的双金属栅,并安排制造NMOS(n-NMOS N沟道MOS Ns),而PMOS栅电极通过使用两种金属具有不同的功函数,钽和钌。构造:在硅衬底(100)中形成栅绝缘层(110),该栅绝缘层具有区域PMOS和区域NMOS,并由绝缘氧化物层隔离。在栅极绝缘层中形成光致抗蚀剂之后,使用PMOS栅极掩模的图案化工艺进行栅极绝缘层顶部的开口。在开栅绝缘层和光致抗蚀剂中形成具有高工作含量的金​​属层(120)。通过去除光致抗蚀剂,通过剥离方法消除了在光致抗蚀剂上形成的高工作含量的金​​属层,以形成PMOS栅极图案。在衬底上形成光致抗蚀剂之后,具有PMOS栅极图案,通过相同的步骤由具有低功函数的金属(130)制成NMOS栅极图案,使用NMOS栅极掩模。

著录项

  • 公开/公告号KR20050009526A

    专利类型

  • 公开/公告日2005-01-25

    原文格式PDF

  • 申请/专利权人 MAGNACHIP SEMICONDUCTOR LTD.;

    申请/专利号KR20030048859

  • 发明设计人 LEE HEUI SEUNG;

    申请日2003-07-16

  • 分类号H01L21/336;

  • 国家 KR

  • 入库时间 2022-08-21 22:05:56

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