首页> 外国专利> APPARATUS FOR TESTING SIGNAL PROCESSING DEVICE AND TESTING METHOD THEREOF, PARTICULARLY FOR SHORTENING TESTING TIME BY ELIMINATING STANDBY TIME FOR DISCHARGING CAPACITOR

APPARATUS FOR TESTING SIGNAL PROCESSING DEVICE AND TESTING METHOD THEREOF, PARTICULARLY FOR SHORTENING TESTING TIME BY ELIMINATING STANDBY TIME FOR DISCHARGING CAPACITOR

机译:用于测试信号处理装置的装置及其测试方法,特别是用于通过消除用于电容器放电的待机时间来缩短测试时间的装置

摘要

PURPOSE: An apparatus of testing a signal processing system and a testing method thereof are provided to shorten a test period by performing a test from a point of time when an analog signal for the test passes through an analog ground by eliminating a standby time for discharging a capacitor. CONSTITUTION: A demodulator(600) includes a plurality of switches operated by a clock having a predetermined period and a plurality of capacitors connected to the switches in order to integrate analog audio signals and output digital audio signal corresponding to the integrated signals. A filter(610) is used for filtering the digital audio signals. A test controller is used for outputting a control signal for discharging a capacitor to the modulator according to a test mode signal.
机译:目的:提供一种测试信号处理系统的设备及其测试方法,以通过消除用于放电的待机时间,从用于测试的模拟信号经过模拟地的时间点开始进行测试,从而缩短测试周期一个电容器。构成:解调器(600)包括:多个开关,其由具有预定周期的时钟操作;以及多个电容器,其连接到所述开关,以便积分模拟音频信号并输出​​与积分信号相对应的数字音频信号。滤波器(610)用于对数字音频信号进行滤波。测试控制器用于根据测试模式信号向调制器输出用于使电容器放电的控制信号。

著录项

  • 公开/公告号KR20050015200A

    专利类型

  • 公开/公告日2005-02-21

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20030053909

  • 发明设计人 LEE SANG HYEON;

    申请日2003-08-04

  • 分类号G01R31/00;

  • 国家 KR

  • 入库时间 2022-08-21 22:05:53

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