首页> 外国专利> NON-VOLATILE SEMICONDUCTOR DEVICE WITH ENHANCED FLOATING GATE STRUCTURE FOR MAXIMIZING PROGRAMMING EFFICIENCY AND MANUFACTURING METHOD THEREOF

NON-VOLATILE SEMICONDUCTOR DEVICE WITH ENHANCED FLOATING GATE STRUCTURE FOR MAXIMIZING PROGRAMMING EFFICIENCY AND MANUFACTURING METHOD THEREOF

机译:具有增强的浮栅结构的非易失性半导体器件,可最大程度地提高编程效率,并提供了一种制造方法

摘要

Purpose: although the application of a low-voltage, a non-volatile semiconductor device and its manufacturing method are by suitably changing the structure setting of a floating gate into the efficiency maximization for making programming. Construction: a non-volatile semiconductor device includes semi-conductive substrate (100), has a region of activation and an isolated area, a source region, a pair of of floating gates, a wordline and a drain region. Source region (120a) is formed in region of activation. A pair of of floating gates (112) are formed in the substrate of region of activation. One lower part of each floating gate, which is extended, roundly forms a channel region of lower part and an edge. Wordline (118) is formed in floating gate. Drain region (120b) is overlapped with word line portion.
机译:目的:尽管施加低压,但是非易失性半导体器件及其制造方法是通过将浮栅的结构设置适当地改变为用于编程的效率最大化来实现的。构造:非易失性半导体器件包括半导体衬底(100),具有激活区域和隔离区域,源极区域,一对浮栅,字线和漏极区域。源极区域120a形成在激活区域中。一对浮栅(112)形成在激活区域的衬底中。每个浮动栅的一个下部延伸,该下部圆形地形成下部和边缘的沟道区域。字线(118)形成在浮栅中。漏极区(120b)与字线部分重叠。

著录项

  • 公开/公告号KR20050020042A

    专利类型

  • 公开/公告日2005-03-04

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20030057684

  • 发明设计人 KWON HYOK KI;

    申请日2003-08-20

  • 分类号H01L27/115;

  • 国家 KR

  • 入库时间 2022-08-21 22:05:49

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