INTEGRATED PCB AND TEST CONTACTOR FOR HIGH-SPEED SEMICONDUCTOR TEST TO MAKE GOOD ELECTRICAL CONTACT BETWEEN POSITIONS ON FLEXIBLE DEVICE AND INTEGRATED CIRCUIT

摘要

PURPOSE: A test interface system for an integrated circuit is provided to make a good electrical contact between the positions on a flexible device and an integrated circuit, by inserting an integrated circuit to be tested into a housing for aligning a contactor in its position, by pushing the integrated circuit to the inside of an increased contact shape and by pushing a PCB(printed circuit board) downward toward an elastic polymer in a concave part of the PCB. CONSTITUTION: An align housing(12) has a cavity(16) for receiving an integrated circuit to be tested and determining the position of the integrated circuit. A PCB(14) includes a non-conductive elastic polymer part located along its surface. A signal transmission unit transmits a test signal from the integrated circuit to an external test electronic apparatus along the PCB.