首页> 外国专利> SEMICONDUCTOR MEMORY DEVICE HAVING VSS/VDD BIT LINE PRECHARGE SCHEME WITH N-TYPE SENSE AMPLIFIERS AND P-TYPE SENSE AMPLIFIERS WITHOUT REFERENCE CELL

SEMICONDUCTOR MEMORY DEVICE HAVING VSS/VDD BIT LINE PRECHARGE SCHEME WITH N-TYPE SENSE AMPLIFIERS AND P-TYPE SENSE AMPLIFIERS WITHOUT REFERENCE CELL

机译:具有VSS / VDD位线预充电方案,具有N型感应放大器和P型感应放大器而无参考单元的半导体存储器

摘要

PURPOSE: A semiconductor memory device having VSS/VDD bit line precharge scheme without reference cell is provided to sense data correctly by including sense amplifiers which are two of P-type sense amplifiers for VSS precharge scheme and two of N-type sense amplifiers for VDD precharge scheme. CONSTITUTION: A semiconductor memory device comprises the first memory cell(M20); the second memory cell(M21); a bit line(BL) connected to the first memory cell(M20); a complementary bit line(BLB) connected to the second memory cell(M21); sense amplifiers for amplifying the voltage difference between the bit line and the complementary bit line. Wherein, the sense amplifiers are one of N-type sense amplifier(NS2) consisting of a pair of cross coupled NMOS transistors(NM21, NM22) and two of P-type sense amplifiers(PS20, PS21) consisting of a pair of cross coupled PMOS transistors(PM21, PM22, PM23, PM24). And the two of P-type sense amplifiers(PS20, PS21) are enabled with time lag successively.
机译:用途:提供一种具有VSS / VDD位线预充电方案而无参考单元的半导体存储器件,以通过包括作为两个VSS预充电方案的P型读出放大器和两个用于VDD的N型读出放大器的读出放大器来正确读出数据预充电方案。组成:一种半导体存储器件,包括第一存储单元(M20);第二存储单元(M21);连接到第一存储单元(M20)的位线(BL);连接到第二存储单元(M21)的互补位线(BLB);感测放大器,用于放大位线和互补位线之间的电压差。其中,所述读出放大器是由一对交叉耦合的NMOS晶体管(NM21,NM22)组成的N型读出放大器(NS2)和由一对交叉耦合的两个P型读出放大器(PS20,PS21)组成的一个PMOS晶体管(PM21,PM22,PM23,PM24)。并且两个P型读出放大器(PS20,PS21)具有一定的时间滞后性。

著录项

  • 公开/公告号KR20050023537A

    专利类型

  • 公开/公告日2005-03-10

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20030059833

  • 发明设计人 NOH KYOUNG JUN;

    申请日2003-08-28

  • 分类号G11C7/06;

  • 国家 KR

  • 入库时间 2022-08-21 22:05:42

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