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GROWTH OF SINGLE NITRIDE-BASED SEMICONDUCTORS USING SUBSTRATE DECOMPOSITION PREVENTION LAYER AND MANUFACTURING OF HIGH-QUALITY NITRIDE-BASED LIGHT EMITTING DEVICES
GROWTH OF SINGLE NITRIDE-BASED SEMICONDUCTORS USING SUBSTRATE DECOMPOSITION PREVENTION LAYER AND MANUFACTURING OF HIGH-QUALITY NITRIDE-BASED LIGHT EMITTING DEVICES
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机译:基质分解防止层和高品质氮化物发光器件制造的单氮化物半导体的生长
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摘要
The present invention relates to a vertical-type light emitting device manufacturing method using the single-crystal nitride-based semiconductor material growth on the top conductive substrate: By default, the removed substrate preparing organic debris, including the natural oxide layer which is present above a conductive substrate, a high temperature / substrate decomposition for protecting the strain of the substrate in an atmosphere of hydrogen-barrier film (substrate decomposition prevention Layer: SDPL) as a thick aluminum oxide (AlxOy) or aluminum oxides of nitrogen (AlxNyOz) a thin layer deposited as a matrix, nitride-based buffer layer (nitride-based buffer and a single crystal nitride-based semiconductor including layer) are sequentially stacked, a decomposition preventing the thin film layer of aluminum oxide or aluminum nitrogen oxide thin film layer in the matrix is the transparent thin film layer composed of a single layer (Single layer) or a double layer (Bi-layer) It is stacked, and the a-aluminum oxide or Degradation prevents the thin film layer composed of material containing aluminum oxides of nitrogen in the matrix is a single crystal (Single Crystal) or poly (Polycrystal) thin film layer in order to grow a single-crystal nitride-based semiconductor of high quality at the same time as the conductive substrate deformation and degradation protection in high temperature / hydrogen atmosphere It should be formed. Using the offer / development method in the present invention to grow a high quality single crystal nitride-based semiconductor growth, in order to create a new concept in the nitride-based light emitting device film preferentially substrate degradation (Substrate Decomposition Prevention Layer: SDPL) of aluminum oxide or aluminum NOx that the thickness of the deposition to less than 10 micron meters is preferred. A light emitting element using a nitride-based semiconductor single crystals developed by the present invention is a high capacity, large area, and high-performance light emitting device manufactured in high luminance.
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