首页> 外国专利> GROWTH OF SINGLE NITRIDE-BASED SEMICONDUCTORS USING SUBSTRATE DECOMPOSITION PREVENTION LAYER AND MANUFACTURING OF HIGH-QUALITY NITRIDE-BASED LIGHT EMITTING DEVICES

GROWTH OF SINGLE NITRIDE-BASED SEMICONDUCTORS USING SUBSTRATE DECOMPOSITION PREVENTION LAYER AND MANUFACTURING OF HIGH-QUALITY NITRIDE-BASED LIGHT EMITTING DEVICES

机译:基质分解防止层和高品质氮化物发光器件制造的单氮化物半导体的生长

摘要

The present invention relates to a vertical-type light emitting device manufacturing method using the single-crystal nitride-based semiconductor material growth on the top conductive substrate: By default, the removed substrate preparing organic debris, including the natural oxide layer which is present above a conductive substrate, a high temperature / substrate decomposition for protecting the strain of the substrate in an atmosphere of hydrogen-barrier film (substrate decomposition prevention Layer: SDPL) as a thick aluminum oxide (AlxOy) or aluminum oxides of nitrogen (AlxNyOz) a thin layer deposited as a matrix, nitride-based buffer layer (nitride-based buffer and a single crystal nitride-based semiconductor including layer) are sequentially stacked, a decomposition preventing the thin film layer of aluminum oxide or aluminum nitrogen oxide thin film layer in the matrix is ​​the transparent thin film layer composed of a single layer (Single layer) or a double layer (Bi-layer) It is stacked, and the a-aluminum oxide or Degradation prevents the thin film layer composed of material containing aluminum oxides of nitrogen in the matrix is ​​a single crystal (Single Crystal) or poly (Polycrystal) thin film layer in order to grow a single-crystal nitride-based semiconductor of high quality at the same time as the conductive substrate deformation and degradation protection in high temperature / hydrogen atmosphere It should be formed. Using the offer / development method in the present invention to grow a high quality single crystal nitride-based semiconductor growth, in order to create a new concept in the nitride-based light emitting device film preferentially substrate degradation (Substrate Decomposition Prevention Layer: SDPL) of aluminum oxide or aluminum NOx that the thickness of the deposition to less than 10 micron meters is preferred. A light emitting element using a nitride-based semiconductor single crystals developed by the present invention is a high capacity, large area, and high-performance light emitting device manufactured in high luminance.
机译:垂直式发光器件的制造方法技术领域本发明涉及一种在顶部导电性基板上生长基于单晶氮化物的半导体材料的垂直型发光器件的制造方法:默认地,去除的基板制备有机碎片,包括上面存在的天然氧化物层。导电基板,高温/基板分解以保护作为厚氧化铝(AlxOy)或氮氧化铝(AlxNyOz)的氢阻挡膜(基板分解防止层:SDPL)气氛中的基板应变a依次沉积一层薄的基体层,氮化物基缓冲层(氮化物基缓冲层和单晶氮化物基半导体包括层),以防止铝氧化物薄膜或铝氮氧化物薄膜层分解。基质是由单层(单层)或双层(双层)组成的透明薄膜层。 s堆叠,并且a-氧化铝或降解防止基质中含有氮氧化铝的材料组成的薄膜层是单晶(单晶)或多(polycrystal)薄膜层,以便生长应当同时形成高质量的单晶氮化物基半导体,同时在高温/氢气氛中保护导电基板变形和退化。使用本发明中的供应/开发方法来生长高质量的基于单晶氮化物的半导体生长,以便在基于氮化物的发光器件膜中优先考虑衬底退化的新概念产生(衬底分解防止层:SDPL)对于氧化铝或铝NOx,优选沉积厚度小于10微米。使用通过本发明开发的氮化物基半导体单晶的发光元件是以高亮度制造的高容量,大面积且高性能的发光器件。

著录项

  • 公开/公告号KR20050081208A

    专利类型

  • 公开/公告日2005-08-18

    原文格式PDF

  • 申请/专利权人 JANG GOO HYUN;

    申请/专利号KR20050068785

  • 发明设计人 JANG GOO HYUN;

    申请日2005-07-28

  • 分类号H01L33/00;

  • 国家 KR

  • 入库时间 2022-08-21 22:04:47

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