Characterization of the machine from eos / esd - behavior of ics

摘要

A method for the testing of electronic components on dielectric strength, accordingly,– an electronic component is connected to an operating voltage source– a dielectric strength of connection of the component to be tested with a first capacitor (c1), which is charged with a first voltage is connected,– in a subsequent step of the connection to be tested with a second capacitor (c2), which is charged with a second voltage, is connected separately,– the component is then checked whether a damage has occurred.