Test system for testing an integrated circuit, an integrated circuit and test system

摘要

The present invention relates to a test system for testing of an integrated circuit with a tester unit, which has one or more connecting lines, in order to connect the integrated circuit, for testing a test signal and / or a supply voltage to the integrated circuit can be applied, wherein a sixth low-pass filters with at least one of the connecting lines is connected an interference signal to the connecting line to the quality of the test signal and / or the quality of the supply voltage, to reduce.