首页> 外国专利> FLAW INSPECTION DEVICE OF MAGNETIC TAPE AND FLAW INSPECTION METHOD USING IT

FLAW INSPECTION DEVICE OF MAGNETIC TAPE AND FLAW INSPECTION METHOD USING IT

机译:磁带的跳检装置及使用该方法的跳检方法

摘要

PROBLEM TO BE SOLVED: To provide a flaw inspection device of a magnetic tape capable of preventing the normal part of the magnetic tape from being recognized as a flaw part by mistake and capable of more accurately detecting the position of the flaw part, and an flaw inspection method using it.;SOLUTION: The whole in the lateral direction of the magnetic tape T is irradiated with the irradiation light transmitted through a filter 24 having a stripe pattern formed thereon and the surface on the side opposite to the irradiated surface R irradiated with the irradiation light of the magnetic tape T is supported by a backup roll 12 while the irradiated surface R is photographed to detect the flaw part Td of the magnetic tape T on the basis of the stripe pattern of the photographed irradiated surface R.;COPYRIGHT: (C)2006,JPO&NCIPI
机译:解决的问题:提供一种磁带的缺陷检查装置,其能够防止将磁带的正常部分错误地识别为缺陷部分,并且能够更准确地检测缺陷部分的位置和缺陷。解决方案:解决方案:磁带T的整个横向方向被辐射光照射,该辐射光通过在其上形成有条纹图案的滤光器24以及与被辐照表面R相反的一侧的表面透射的滤光器24。磁带T的照射光由支撑辊12支撑,同时对被照射的表面R进行拍摄,以根据拍摄的被照射表面R的条纹图案检测磁带T的缺陷部分Td; (C)2006,日本特许厅

著录项

  • 公开/公告号JP2006017481A

    专利类型

  • 公开/公告日2006-01-19

    原文格式PDF

  • 申请/专利权人 FUJI PHOTO FILM CO LTD;

    申请/专利号JP20040193132

  • 发明设计人 GOTO FUMIO;

    申请日2004-06-30

  • 分类号G01N21/892;

  • 国家 JP

  • 入库时间 2022-08-21 21:55:29

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号