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MAGNETORESISTIVE EFFECT ELEMENT, THIN-FILM MAGNETIC HEAD, HEAD GIMBAL ASSEMBLY, HEAD ARM ASSEMBLY, AND MAGNETIC DISK DEVICE

机译:磁阻效应元件,薄型磁头,​​头金刚组件,头臂组件和磁碟装置

摘要

PROBLEM TO BE SOLVED: To obtain the large change of a magnetic resistance when a current is made to flow perpendicularly to the surface of each layer constituting a magnetoresistive effect element.;SOLUTION: The MR element 5 is provided with a nonmagnetic conductive layer 24, a free layer 25 which is arranged so that the layer 25 may adjoin one surface of the nonmagnetic conductive layer 24 and changes in the direction of magnetization in accordance with the external magnetic field, and a pinned layer 23 which is arranged so that the layer 23 may adjoin the other surface of the nonmagnetic conductive layer 24 and is fixed in the direction of magnetization. The free layer 25 has first and second magnetic layers F1 and F2 and a coupling layer 40 arranged between the magnetic layers F1 and F2. The second magnetic layer F2 is arranged nearer to the pinned layer 23 than the first magnetic layer F1, and the magnetic layers F1 and F2 are coupled with each other in an antiferromagnetic state through the coupling layer 40. The bulk scattering coefficient β of the first magnetic layer F1 has a negative value and that β of the second magnetic layer F2 has a positive value.;COPYRIGHT: (C)2006,JPO&NCIPI
机译:要解决的问题:当使电流垂直于构成磁阻效应元件的每一层的表面垂直流动时,要获得大的磁阻变化;解决方案:MR元件5设有非磁性导电层24,自由层25和被钉扎层23被布置成使层25可以邻接非磁性导电层24的一个表面并且根据外部磁场在磁化方向上变化,自由层25被布置成使得层23可以在非磁性导电层24的另一个表面上邻接的金属膜可以沿磁化方向固定。自由层25具有第一磁性层F1和第二磁性层F2以及布置在磁性层F1和F2之间的耦合层40。第二磁性层F2布置成比第一磁性层F1更靠近被钉扎层23,并且磁性层F1和F2通过耦合层40以反铁磁状态彼此耦合。第一磁性层F1的β为负,β为负。第二磁性层F2的厚度为正值。版权所有:(C)2006,JPO&NCIPI

著录项

  • 公开/公告号JP2005347512A

    专利类型

  • 公开/公告日2005-12-15

    原文格式PDF

  • 申请/专利权人 TDK CORP;

    申请/专利号JP20040165374

  • 发明设计人 MIYAUCHI DAISUKE;MIZUNO TOMOHITO;

    申请日2004-06-03

  • 分类号H01L43/08;C22C19/03;C22C19/07;C22C38/00;G11B5/39;H01F10/16;H01F10/32;H01L43/10;

  • 国家 JP

  • 入库时间 2022-08-21 21:53:05

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