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Inductively coupled plasma control method and inductively coupled plasma processing apparatus

机译:感应耦合等离子体控制方法及感应耦合等离子体处理装置

摘要

PROBLEM TO BE SOLVED: To properly control a density of plasma generating in a vacuum chamber.;SOLUTION: The inductively-coupled plasma processing apparatus is equipped with a vacuum changer 10 having a quartz shield board 11 around a peripheral wall, an inductive coil 16 provided outside of the quartz shield board 11, a first high-frequency power supply to supply high-frequency power to the inductive coil 16, and a first matching unit provided between the first high-frequency power supply and the inductive coil 16. A high-frequency impedance value formed by the inductive coil 16 and the quartz shield board 11 is calculated with a condition of a metal body 22 arranged in the vacuum chamber 10. The shape of the inductive coil 16 or the quartz shield board 11 is changed to make the calculated high-frequency impedance value to come near the given value.;COPYRIGHT: (C)2003,JPO
机译:解决的问题:为了适当地控制在真空室中产生的等离子体的密度;解决方案:电感耦合等离子体处理设备配备有真空变换器10,该真空变换器具有在外围壁周围的石英屏蔽板11,感应线圈16。设置在石英屏蔽板11的外部的第一高频电源向感应线圈16供应高频电力,以及设置在第一高频电源和感应线圈16之间的第一匹配单元。由布置在真空室10中的金属体22的条件来计算由感应线圈16和石英屏蔽板11形成的高频阻抗值。改变感应线圈16或石英屏蔽板11的形状以使得计算出的高频阻抗值接近给定值。版权所有:(C)2003,日本特许厅

著录项

  • 公开/公告号JP3841726B2

    专利类型

  • 公开/公告日2006-11-01

    原文格式PDF

  • 申请/专利权人 松下電器産業株式会社;

    申请/专利号JP20020172966

  • 发明设计人 立岩 健二;

    申请日2002-06-13

  • 分类号H05H1/46;C23C16/505;H01L21/205;H01L21/3065;

  • 国家 JP

  • 入库时间 2022-08-21 21:51:09

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