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High performance PFET header in hybrid orientation technology for leakage reduction in digital CMOS VLSI designs

机译:混合定向技术中的高性能PFET接头,用于减少数字CMOS VLSI设计中的泄漏

摘要

Discloses are CMOS circuit designs that combine MTCMOS and hybrid orientation technology to achieve the dual objectives of high performance and low standby leakage power. The invention utilizes novel combinations of a thick-oxide high-VTH PFET header with various gate- and body-biased schemes in HOT technology to significantly reduce the performance penalty associated with conventional PFET headers. A first embodiment of the invention provides a HOT-B high-VTH thick oxide bulk PFET header scheme. This header scheme can be expanded by application of a positive gate bias VPOS (VPOSVDD) to the HOT-B PFET header during standby mode and a negative gate bias VNEG (VNEGGND) in active mode. Another embodiment provides a HOT-A high-VTH thick oxide SOI PFET header scheme. A further embodiment provides a HOT-A body biased high-VTH thick oxide SOI PFET header scheme.
机译:公开了结合MTCMOS和混合取向技术以实现高性能和低待机泄漏功率的双重目标的CMOS电路设计。本发明在HOT技术中利用了厚氧化物高VTH PFET插头与各种栅极和体偏方案的新颖组合,以显着降低与传统PFET插头相关的性能损失。本发明的第一实施例提供了一种HOT-B高VTH厚氧化物体PFET集管头方案。可以通过在待机模式下将正栅极偏压VPOS(VPOS> VDD)施加到HOT-B PFET头以及在活动模式下施加负栅极偏压VNEG(VNEG

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