A test system comprises a first ground line for connecting a first ground terminal of a tester to a second ground terminal of a prober; a ground plane that covers the bottom surface of the tester and the bottom surface of the prober and is connected by a second ground line to the first ground terminal; and a connection box comprised of a power supply block that supplies the power supply to the tester and the prober each time, receives a first power supply line from the power distribution panel and branches to second and third ground lines for the tester and the prober, and a ground terminal block that receives the third ground line from the power distribution panel and is connected by a fourth ground line to the first ground terminal.
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