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High Temperature and Chemical Resistant Process for Wafer Thinning and Backside Processing

机译:晶圆减薄和背面加工的高温耐化学腐蚀工艺

摘要

A process which uses a silicone resin to form a wafer-to-carrier bonded package that enables wafer thinning and backside processing while the cured resin exhibits high chemical and thermal resistance. The process is versatile in that the constructed wafer package allows for a wide range of chemical exposures to include dilute acid and base etchants, resist and residue strippers, electroplating chemistries, and also providing use in a range of deposition and etch processes that may exceed 300° C. The process utilizes a mixture of silicone monomers that when applied to semiconductor wafers by a spin-coat application, the result is a planarization of the frontside device area, and when a subsequent thin coat is applied will facilitate bonding of the wafer-to-carrier package when heat and pressure are applied. The cured silicone bonded wafer-to-carrier package allows for wafer thinning consistent to industry objectives. Backside processing may include thermal oxide deposition, installed vias, and subsequent metallization in plating baths. Upon completion of a thinned and processed wafer, detachment occurs as described in prior art. Specialty chemical systems which completely dissolves the cured silicone and allows the wafer substrate to be easily rinsed and dried and become available for subsequent processing or final dicing and packaging.
机译:一种使用有机硅树脂形成晶片与载体结合的封装的方法,该封装可实现晶片薄化和背面处理,而固化后的树脂则具有很高的耐化学性和耐热性。该工艺具有多种用途,因为所构造的晶圆封装允许进行广泛的化学暴露,包括稀酸和碱蚀刻剂,抗蚀剂和残留物剥离剂,电镀化学,还可以用于可能超过300的一系列沉积和蚀刻工艺中°C。该工艺利用了有机硅单体的混合物,当通过旋涂将硅酮单体应用于半导体晶圆时,其结果是使正面器件区域平坦化,并且当随后涂覆薄涂层时,将有助于晶圆的键合。施加热量和压力时将其包装到运输工具上。固化的硅酮键合晶圆对载体封装允许晶圆减薄,符合行业目标。背面处理可能包括热氧化物沉积,安装的过孔以及随后在电镀液中的金属化。在完成减薄和加工的晶片后,如现有技术所述发生分离。特殊化学系统可完全溶解固化的硅酮,并使晶片基板易于冲洗和干燥,可用于后续处理或最终切割和包装。

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