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Silicon carbide devices with hybrid well regions and methods of fabricating silicon carbide devices with hybrid well regions

机译:具有混合阱区域的碳化硅器件和具有混合阱区域的碳化硅器件的制造方法

摘要

MOS channel devices and methods of fabricating such devices having a hybrid channel are provided. Exemplary devices include vertical power MOSFETs that include a hybrid well region of silicon carbide and methods of fabricating such devices are provided. The hybrid well region may include an implanted p-type silicon carbide well portion in a p-type silicon carbide epitaxial layer, an implanted p-type silicon carbide contact portion that contacts the implanted p-type silicon carbide well portion and extends to a surface of the p-type epitaxial layer and/or an epitaxial p-type silicon carbide portion, at least a portion of the epitaxial p-type silicon carbide well portion corresponding to a p-type channel region of the MOSFET.
机译:提供了MOS沟道器件以及制造具有混合沟道的这种器件的方法。示例性的器件包括垂直功率MOSFET,其包括碳化硅的混合阱区域,并且提供了制造这种器件的方法。混合阱区可以包括在p型碳化硅外延层中的注入的p型碳化硅阱部分,与注入的p型碳化硅阱部分接触并延伸到表面的注入的p型碳化硅接触部分。在p型外延层和/或外延p型碳化硅部分中,外延p型碳化硅阱部分的至少一部分对应于MOSFET的p型沟道区域。

著录项

  • 公开/公告号US2005280004A1

    专利类型

  • 公开/公告日2005-12-22

    原文格式PDF

  • 申请/专利权人 MRINAL KANTI DAS;SEI-HYUNG RYU;

    申请/专利号US20040873394

  • 发明设计人 MRINAL KANTI DAS;SEI-HYUNG RYU;

    申请日2004-06-22

  • 分类号H01L29/15;H01L21/00;

  • 国家 US

  • 入库时间 2022-08-21 21:44:30

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