Boundary-scan circuit used for analog and digital testing of an integrated circuit

摘要

Method and apparatus are described for providing analog capability with boundary-scanning for an integrated circuit. The integrated circuit includes a boundary-scan controller (1517) coupled to an analog-to-digital converter (200). An analog channel is selected for input to the analog-to-digital converter (200). Analog information is converted to digital information by the analog-to-digital converter (200), and then such digital information may be stored in data registers (209) for reading out via the boundary-scan controller (1517).