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Memory array including multiple-gate charge trapping non-volatile cells

机译:存储器阵列,包括多栅电荷捕获非易失性单元

摘要

An array of multiple-gate memory cells includes sectors. The sectors include at least one row of multiple-gate memory cells. The multiple-gate memory cells comprise a semiconductor body and a plurality of gates arranged in series on the semiconductor body. A charge storage structure on the semiconductor body includes charge trapping locations beneath each of all or some of the gates in the plurality of gates. Word lines and bit lines source and drain bias voltages to the semiconductor body near a first gate and a last gate in the series, and to the plurality of gates are included. The multiple-gate memory cell includes a continuous, multiple-gate channel region beneath the plurality of gates in the series, with charge storage locations between some or all of the gates. Sector select lines are included to couple selected sectors to the bit lines.
机译:多栅存储单元的阵列包括扇区。扇区包括至少一行多栅存储单元。多个栅极存储单元包括半导体本体和在半导体本体上串联布置的多个栅极。半导体本体上的电荷存储结构包括在多个栅极中的所有或某些栅极中的每个之下的电荷俘获位置。包括字线和位线,其向串联的第一栅极和最后栅极附近的半导体本体以及向多个栅极提供源极和漏极偏置电压。多栅存储单元包括在串联的多个栅下方的连续的多栅沟道区域,在一些或所有栅之间具有电荷存储位置。包括扇区选择线以将所选扇区耦合到位线。

著录项

  • 公开/公告号EP1615230A1

    专利类型

  • 公开/公告日2006-01-11

    原文格式PDF

  • 申请/专利权人 MACRONIX INTERNATIONAL CO. LTD.;

    申请/专利号EP20050013506

  • 发明设计人 YEH CHIH-CHIEH;

    申请日2005-06-22

  • 分类号G11C16/04;

  • 国家 EP

  • 入库时间 2022-08-21 21:29:22

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