首页> 外国专利> Apparatus and method for detecting scattering material by terahertz wave transmission while eliminating unscattered component transmitted in a rectilinear manner

Apparatus and method for detecting scattering material by terahertz wave transmission while eliminating unscattered component transmitted in a rectilinear manner

机译:用于通过太赫兹波透射来检测散射材料同时消除以直线方式透射的未散射成分的设备和方法

摘要

There is disclosed an apparatus comprising: a terahertz wave generation device (12) which generates a terahertz wave (2); a terahertz wave irradiation device (14) which irradiates an object (1) to be inspected with the terahertz wave; and a scattered intensity detection device (20) comprising a shielding member (27) which blocks the rectilinear, unscattered wave component (3) of the terahertz wave which has passed through the object to be inspected. Thus the intensity of the scattered wave component (4) is detected, and a scattering material such as powder or foam contained in an envelope, a capsule, a container or the like forming the object (1) is detected in a non-destructive manner without unsealing the envelope or the like.
机译:公开了一种设备,包括:太赫兹波产生装置(12),其产生太赫兹波(2);以及太赫兹波照射装置(14),以太赫兹波照射被检查物(1)。散射强度检测装置(20),其具有遮蔽部件(27),该遮蔽部件(27)遮挡已通过被检体的太赫兹波的直线状,非散射波成分(3)。因此,检测了散射波成分(4)的强度,并且以无损方式检测了包含在形成物体(1)的信封,胶囊,容器等中的粉末或泡沫等散射材料。无需拆封信封等。

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