首页> 外国专利> A HIGH SPEED LOW POWER CONSUMPTION PHASE CHANGE MEMORY CELL ARRAY STRUCTURE AND HIGH DENSITY MEMORY DEVICE ARCHITECTURE HAVING THE SAME

A HIGH SPEED LOW POWER CONSUMPTION PHASE CHANGE MEMORY CELL ARRAY STRUCTURE AND HIGH DENSITY MEMORY DEVICE ARCHITECTURE HAVING THE SAME

机译:具有相同功能的高速,低功耗相变存储单元阵列结构和高密度存储设备架构

摘要

The present invention is advantageous for high-density and high capacity with low power consumption, reducing the number of access transistors, by increasing the width (Width) of the access transistor can provide the current required for the phase change of the variable resistance (R C ) sufficiently, the sensing (Sensing) method and the conventional phase change memory cell structure and to implement a power to drive low power phase change memory cell array structure of a number of times or less compared. Phase change memory cell array structure of the present invention, respectively, and a memory unit, each single one terminal commonly connected to the plurality of phase-change resistive element through the active region formed on a substrate; The plurality of phase change resistance element is connected in common the active region of the first terminal, the common word line and the gate to the plurality of phase-change resistive element, the transistor having a second terminal connected to a power source side; And a plurality of bit lines each connected to another one terminal of said plurality of phase-change resistive element.
机译:本发明对于具有低功耗的高密度和高容量是有利的,通过增加存取晶体管的宽度(Width)可以提供可变电阻(R)的相变所需的电流,从而减少存取晶体管的数量。 C ),充分地利用了感测(Sensing)方法和传统的相变存储单元结构,并实现了驱动低功耗相变存储单元阵列结构的次数相比较少。本发明的相变存储单元阵列结构和存储单元,每个单个端子通过形成在基板上的有源区共同连接到多个相变电阻元件;多个相变电阻元件在第一端子的有源区域,公共字线和栅极的公共区域连接到多个相变电阻元件,晶体管的第二端子连接在电源侧。并且多条位线分别连接到所述多个相变电阻元件的另一端子。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号