首页> 外国专利> DRY-ETCHING METHOD AND APPARATUS, PHOTOMASKS AND METHOD FOR THE PREPARATION THEREOF, AND SEMICONDUCTOR CIRCUITS AND METHOD FOR THE FABRICATION THEREOF

DRY-ETCHING METHOD AND APPARATUS, PHOTOMASKS AND METHOD FOR THE PREPARATION THEREOF, AND SEMICONDUCTOR CIRCUITS AND METHOD FOR THE FABRICATION THEREOF

机译:干蚀刻方法和装置,照相制版及其制备方法,半导体电路及其制造方法

摘要

A dry-etching method comprises the step of dry-etching a metal thin film as a chromium-containing film, wherein the method is characterized by using, as an etching gas, a mixed gas including (a) a reactive ion etching gas, which contains an oxygen-containing gas and a halogen-containing gas, and (b) a reducing gas added to the gas component (a), in the process for dry-etching the metal thin film. The dry-etching method permits the production of a photomask by forming patterns to be transferred to a wafer on a photomask blank. The photomask can in turn be used for manufacturing semiconductor circuits. The method permits the decrease of the dimensional difference due to the coexistence of coarse and dense patterns in a plane and the production of a high precision pattern-etched product. IMAGE
机译:干蚀刻方法包括对金属薄膜作为含铬膜进行干蚀刻的步骤,其中该方法的特征在于使用包括(a)反应性离子蚀刻气体的混合气体作为蚀刻气体。在干法蚀刻金属薄膜的过程中,包含含氧气体和含卤素气体,以及(b)添加到气体成分(a)中的还原性气体。干蚀刻法允许通过在光掩模坯料上形成要转移到晶片上的图案来生产光掩模。该光掩模又可以用于制造半导体电路。该方法允许由于平面中的粗糙和密集图案的共存而减小尺寸差,并且可以产生高精度的图案蚀刻产品。 <图像>

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号