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Articles having a protective coating and cathodic TARGET FOR PERFORMANCE coated products

机译:具有防护涂层和阴极TARGET FOR PERFORMANCE涂层产品的物品

摘要

1.the product containing the substrate, the coating applied at least to a part of the substrate, a protective coating applied on at least a part u0440u0430u0431u043eu0447u0435u0433 on the u043fu043eu043au0440u044bu0442u0438u00a0, with a cover and a protective coating covering the package, the package provides the u0438u0437u043b supplies the protective coating u0443u0447u0435u043du0438u00a0 exceeding the u0438u0437u043bu0443u0447u0435u043du0438u00a0 one working u043fu043eu043au0440u044bu0442u0438u00a0,the protective coating has a thickness in the range of more than 100 e to less than 10 mk, and the protective coating has a coefficient of u043eu0442u0440u0430u0436u0435u043du0438u00a0 ranging from 1.4 to 2, and the u0449u0438u0442u043du043eu0435 coating includes a first layer formed at least on the part of the working u043fu043eu043au0440u044bu0442u0438u00a0, and a second layer formed at least on a part of the first wow u0441u043bu043eu00a0, the first layer contains from 50 to 100 mas.per cent of u0430u043bu044eu043cu0438u043du0438u00a0 and 50 to 0 mas.% of u043au0440u0435u043cu043du0438u00a0, and the second layer contains from 50 to 100 mas.% of u043au0440u0435u043cu043du0438u00a0 and 50 to 0 mas.% oxide u0430u043bu044eu043cu0438u043du0438u00a0.;2. the product for 1, in which the product u00a0u0432u043bu00a0u0435u0442u0441u00a0 transparent element of the vehicle with the engine.;3. the product for 1, in which the first layer contains between 70 and 100 mas.% oxide u0430u043bu044eu043cu0438u043du0438u00a0 and from 30 to 10 mas.% of u043au0440u0435u043cu043du0438u00a0.;4. the product for 1, in which the first layer has a thickness in the range from 50's to 1 mc.;5. the product for 1, in which the first layer has a thickness in the range of from 100 to 250 e e.;6. the product for 1, in which the second layer contains between 70 and 100 mas.% of u043au0440u0435u043cu043du0438u00a0 and from 30 to 10 mas.% oxide u0430u043bu044eu043cu0438u043du0438u00a0.;7. the product for 1, in which the second layer has a thickness in the range from 50 to 2000.;8. the product for 1, in which the second layer has a thickness in the range from 300 to 500.;9.monolithic transparent element containing u0441u0442u0435u043au043bu00a0u043du043du0443u044e substrate, a coating applied to at least a part u0441u0442u0435u043au043bu00a0u043du043du043eu0439 substrate, protective coating, n u0430u043du0435u0441u0435u043du043du043eu0435, at least, on the part of the working u043fu043eu043au0440u044bu0442u0438u00a0 education covering package with protective coating containing oxide u0430u043bu044eu043cu0438u043du0438u00a0, has thickness in the range of from 1 to 10 mk,the protective coating includes a first layer formed at least on the part of the working u043fu043eu043au0440u044bu0442u0438u00a0, and a second layer formed at least on the as part of the first u0441u043bu043eu00a0, the first layer contains from 50 to 100 mas.% oxide u0430u043bu044eu043cu0438u043du0438u00a0 and 50 to 0 mas.% of u043au0440u0435u043cu043du0438u00a0, and the second layer contains from 50 to 100% of the mas. u0440u0435u043cu043du0438u00a0 and 50 to 0 mas.% oxide u0430u043bu044eu043cu0438u043du0438u00a0.;10.a product comprising a substrate, at least one reflecting the infrared part of the solar energy, a dielectric coating applied at least over part of the substrate, a protective coating applied on at least a part of u043fu043eu043au0440u044bu0442u0438u00a0, the protective coating has a thickness in the range of more than 100 e to less than 10 mk and has u043fu0440u0435u043bu043eu043cu043bu0435u043du0438u00a0 rate ranging from 1.4 to 1.8 and the protective coating includes a first layer formed at least on the part of the working u043fu043eu043au0440u044bu0442u0438u00a0, and a second layer formed at me d, on the part of the first u0441u043bu043eu00a0, the first layer contains from 50 to 100 mas.% oxide u0430u043bu044eu043cu0438u043du0438u00a0 and 50 to 0 mas.% of u043au0440u0435u043cu043du0438u00a0, and the second layer contains from 50 to 100% u0434u0438u043eu043a mas. sid u043au0440u0435u043cu043du0438u00a0 and 50 to 0 mas.% oxide u0430u043bu044eu043cu0438u043du0438u00a0.;11. the system from a source of alternating current and u044du043bu0435u043au0442u0440u043eu043fu0438u0442u0430u043du0438u00a0 cathode target, u0441u043eu0434u0435u0440u0436u0430u0449u0430u00a0 u043au0430u0442u043eu0434u043du0443u044e target containing aluminum in the range of from 5 to 100% and silicon in dia mas. u043fu0430u0437u043eu043du0435 from 0 to 95 mas.%.;12. system for the p.11, in which the content of u0430u043bu044eu043cu0438u043du0438u00a0 u043du0430u0445u043eu0434u0438u0442u0441u00a0 ranging from 20 to 80 mas.%, and the u043au0440u0435u043cu043du0438u00a0 ranging from 20 to 80 mas.%.;13. system for the p.11, in which the content of u0430u043bu044eu043cu0438u043du0438u00a0 u043du0430u0445u043eu0434u0438u0442u0441u00a0 ranging from 20 to 70 mas.%, and the u043au0440u0435u043cu043du0438u00a0 ranging from 30 to 80 mas.%.;14. system for the p.11, in which the content of u0430u043bu044eu043cu0438u043du0438u00a0 u043du0430u0445u043eu0434u0438u0442u0441u00a0 ranging from 50 to 80 mas.%, and the u043au0440u0435u043cu043du0438u00a0 ranging from 20 to 50 mas.%.;15. system for the p.11, in which the content of u0430u043bu044eu043cu0438u043du0438u00a0 u043du0430u0445u043eu0434u0438u0442u0441u00a0 ranging from 60 to 70 mas.%, and the u043au0440u0435u043cu043du0438u00a0 ranging from 30 to 40 mas.%.;16. system for the p.11, in which the content of u0430u043bu044eu043cu0438u043du0438u00a0 u043du0430u0445u043eu0434u0438u0442u0441u00a0 ranging from 35 to 100 mas.%, and the u043au0440u0435u043cu043du0438u00a0 ranged from 0 to 65 mas.%.;17. system for the p.11, in which aluminum and silicon selected from mixtures or alloys thereof.;18. system for the p.11, in which a target further contains at least one u043fu0440u0438u0441u0430u0434u043au0443 selected from chromium, u0433u0430u0444u043du0438u00a0, u0438u0442u0442u0440u0438u00a0, u043du0438u043au0435u043bu00a0, boron, phosphorus, titanium, u0446u0438u0440u043au043eu043du0438u00a0, t u0430u043du0442u0430u043bu0430, u043du0438u043eu0431u0438u00a0 and their mixtures or combinations.;19. system in which the cathode u00a0u0432u043bu00a0u0435u0442u0441u00a0 p.11, cylindrical u043cu0430u0433u043du0435u0442u0440u043eu043du043du043eu0439 target.;20. system for the p.11, which u00a0u0432u043bu00a0u0435u0442u0441u00a0 cylindrical cathode target of magnetron type.;21. system for the p.11, which u00a0u0432u043bu00a0u0435u0442u0441u00a0 flat cathode with the cathode.;22. system in which the cathode u00a0u0432u043bu00a0u0435u0442u0441u00a0 p.11, a cathode with a flat.;23. the system further u0441u043eu0434u0435u0440u0436u0430u0449u0430u00a0 p.11, plasma u0438u0437u043bu0443u0447u0435u043du0438u00a0 optical monitoring system.;24. system u044du043bu0435u043au0442u0440u043eu043fu0438u0442u0430u043du0438u00a0 p.11, in which the source of alternating current includes a circuit for automatic u0443u043fu0440u0430u0432u043bu0435u043du0438u00a0 reverse u0441u0432u00a0u0437u044cu044e on u043du0430u043fu0440u00a0u0436u0435u043du0438u044e.;25. system for the p.11, in which the cathode is u0434u043bu00a0 u0438u0441u043fu043eu043bu044cu0437u043eu0432u0430u043du0438u00a0 with capacity in the range of from 50 to 500 kw.;26. system for the p.11, in which the cathode is u0434u043bu00a0 u0438u0441u043fu043eu043bu044cu0437u043eu0432u0430u043du0438u00a0 at a frequency in the range from 10 to 100 khz.;27. system for the p.11, in which the cathode is u0434u043bu00a0 u0438u0441u043fu043eu043bu044cu0437u043eu0432u0430u043du0438u00a0 at a frequency in the range of from 30 to 70 khz.;28. the system further u0441u043eu0434u0435u0440u0436u0430u0449u0430u00a0 p.11, at least one gas selected from argon, oxygen, nitrogen, u043du0438u0442u0440u043eu043au0441u0438u0434u0430 and their mixtures or combinations.;29. the system further u0441u043eu0434u0435u0440u0436u0430u0449u0430u00a0 p.11, argon gas and at least one other gas selected from oxygen, nitrogen, neon, u0433u0435u043bu0438u00a0, u043du0438u0442u0440u043eu043au0441u0438u0434u0430, ozone and their mixtures or combinations.;30. the target u0434u043bu00a0 plasma u0440u0430u0441u043fu044bu043bu0435u043du0438u00a0, u0441u043eu0434u0435u0440u0436u0430u0449u0430u00a0 aluminum in the range of from 5 to 100 mas.% silicon in the range of from 0 to 95 mas.%.;31. the target u0434u043bu00a0 plasma u0440u0430u0441u043fu044bu043bu0435u043du0438u00a0 on p.30, in which the content of u0430u043bu044eu043cu0438u043du0438u00a0 u043du0430u0445u043eu0434u0438u0442u0441u00a0 ranging from 35 to 100 mas.% and u043au0440u0435u043cu043du0438u00a0 ranged from 0 to 65 mas.%.;32. the target u0434u043bu00a0 plasma u0440u0430u0441u043fu044bu043bu0435u043du0438u00a0 on p.30, in which the content of u0430u043bu044eu043cu0438u043du0438u00a0 u043du0430u0445u043eu0434u0438u0442u0441u00a0 ranging from 40 to 90 mas.% and u043au0440u0435u043cu043du0438u00a0 ranging from 10 to 60 mas.%.;33. the target u0434u043bu00a0 plasma u0440u0430u0441u043fu044bu043bu0435u043du0438u00a0 on p.30, in which the content of u0430u043bu044eu043cu0438u043du0438u00a0 u043du0430u0445u043eu0434u0438u0442u0441u00a0 ranging from 50 to 80 mas.% and u043au0440u0435u043cu043du0438u00a0 ranging from 20 to 50 mas.%.;34. the target u0434u043bu00a0 plasma u0440u0430u0441u043fu044bu043bu0435u043du0438u00a0 on p.30, in which the content of u0430u043bu044eu043cu0438u043du0438u00a0 u043du0430u0445u043eu0434u0438u0442u0441u00a0 ranging from 60 to 70 mas.% and u043au0440u0435u043cu043du0438u00a0 ranging from 30 to 40 mas.%.;35. the target u0434u043bu00a0 plasma u0440u0430u0441u043fu044bu043bu0435u043du0438u00a0 on p.30 in which aluminum and silicon selected from their mixtures or alloys thereof.;36. the target u0434u043bu00a0 plasma u0440u0430u0441u043fu044bu043bu0435u043du0438u00a0 on p.30 in which target additionally contains at least one u043fu0440u0438u0441u0430u0434u043au0443 selected from chromium, u0433u0430u0444u043du0438u00a0, u0438u0442u0442u0440u0438u00a0, u043du0438u043au0435u043bu00a0, bora, s u043eu0441u0444u043eu0440u0430, titanium, tantalum, u0446u0438u0440u043au043eu043du0438u00a0, u043du0438u043eu0431u0438u00a0 and their mixtures or combinations.
机译:1.包含基材的产品,至少在基材的一部分上施加涂层,在至少一部分的表面上施加保护涂层,在至少一部分上u043a u0440 u044b u0442 u0438 u00a0,包装上有盖和保护涂层,包装提供的 u0438 u0437 u043b供应的保护涂层 u0443 u0447 u0435 u043d u0438 u00a0 u0438 u0437 u043b u0443 u0447 u0435 u043d u0438 u00a0一个有效的 u043f u043e u043a u0440 u044b u0442 u0438 u00a0,保护涂层的厚度范围大于100 e到小于10 mk,保护涂层的系数为 u043e u0442 u0440 u0430 u0436 u0435 u043d u0438 u00a0,范围为1.4到2, u0449 u0438 u0442 u043d涂层包括至少在工作部分的一部分上形成的第一层,以及至少在第一层的一部分上形成的第二层, u04 41 u043b u043e u00a0,第一层包含50至100 mas。%的 u0430 u043b u044e u043c u0438 u043d u0438 u00a0和50至0 mas。%的 u043a u0440 u0435 u043c u043d u0438 u00a0,第二层包含50至100 mas。%的 u043a u0440 u0435 u043c u043d u0438 u00a0和50至0 mas。%氧化物 u0430 u043b u044e u043c u0438 u043d u0438 u00a0。; 2。 1的产品,其中产品 u00a0 u0432 u043b u00a0 u0435 u0442 u0441 u00a0带引擎的车辆透明元素。; 3。 1的产品,其中第一层包含70至100 mas。%的氧化物 u0430 u043b u044e u043c u0438 u043d u0438 u00a0和30至10 mas。%的 u043a u0440 u0435 u043c u043d u0438 u00a0。; 4。 1的产品,其中第一层的厚度在50到1 mc。之间; 5。 1的产品,其中第一层的厚度为100到250 e e .; 6。 1的产品,其中第二层包含70到100 mas。%的 u043a u0440 u0435 u043c u043d u0438 u00a0和30到10 mas。%氧化物 u0430 u043b u044e u043c u0438 u043d u0438 u00a0。; 7。 1的产品,其中第二层的厚度在50到2000范围内; 8。 1的产品,其中第二层的厚度在300到500之间。9.包含 u0441 u0442 u0435 u043a u043b u00a0 u043d u043d u043d u0443 u044e基材的整体式透明元件,至少涂覆在一部分 u0441 u0442 u0435 u043a u043b u00a0 u043d u043d u043d u043e u0439基材上的涂层,保护涂层,n u0430 u043d u0435 u0441 u0435 u043d u043d u043d u043e u0435,至少在工作的一部分上 u043f u043e u043a u0440 u044b u0442 u0438 u00a0带有氧化物保护涂层的教育覆盖包 u0430 u043b u044e u043c u0438 u043d u0438厚度在1到10 mk的范围内,保护涂层包括至少在工作部分上形成的第一层,以及至少在第一层的一部分上形成的第二层,第一层包含50到100 mass。%的氧化物 u0430 u043b u043e u043c u0438 u043d u0438 u00a0和 u043a的50到0 mas。% u0440 u0435 u043c u043d u0438 u00a0,第二层包含50%到100%的质量。 u0440 u0435 u043c u043d u0438 u00a0和50至0 mass。%氧化物 u0430 u043b u044e u043c u0438 u043d u0438 u00a0 ;; 10.一种包含基材的产品,至少具有一种反射性太阳能的红外线部分,至少在部分基材上涂覆的介电涂层,在 u043f u043e u043a u0440 u044b u0442 u0438 u00a0的至少一部分上涂覆的保护涂层,具有大于100 e至小于10 mk的厚度,并且 u043f u0440 u0435 u043b u043e u043c u043b u0435 u043d u0438 u00a0的范围为1.4到1.8,并且保护涂层包括至少在工作部分上形成的第一层,以及在第一部分的中间处形成的第二层。 u043e u00a0,第一层包含50至100 mas。%氧化物 u0430 u043b u044e u043c u0438 u043d u0438 u00a0和50至0 mas。% u043a u0440 u0435 u043c u043d u0438 u00a0,第二层包含m 50到100% u0434 u0438 u043e u043a mas。 sid u043a u0440 u0435 u043c u043d u0438 u00a0和50至0 mass。%氧化物 u0430 u043b u044e u043c u0438 u043d u0438 u00a0。; 11。系统来自交流电源和 u044d u043b u0435 u043a u0442 u0440 u043e u043f u0438 u0442 u0430 u043d u0438 u00a0阴极靶, u0441 u043e u0434 u0434 u0435 u0440 u0436 u0430 u0449 u0430 u00a0 u043a u0430 u0442 u043e u0434 u043d u0443 u044e靶材的铝含量范围为5%至100%,且硅含量按直径计。 u043f u0430 u0437 u043e u043d u0435从0到95 mas。%.; 12。第11页的系统,其中 u0430 u043b u044e u043c u0438 u043d u0438 u00a0 u043d u0430 u0445 u043e u0434 u0438 u0442 u0441 u00a0的内容范围为20到80 mas。%,并且 u043a u0440 u0435 u043c u043d u0438 u00a0,范围从20到80 mas。%。; 13。 p.11的系统,其中 u0430 u043b u044e u043c u0438 u043d u043d u0438 u00a0 u043d u0430 u0445 u043e u0434 u0438 u0442 u0442 u0441 u00a0的内容70 mas。%,而 u043a u0440 u0435 u043c u043d u0438 u00a0的范围从30到80 mas。%。;14。 p.11的系统,其中 u0430 u043b u044e u043c u0438 u043d u0438 u00a0 u043d u0430 u0445 u043e u0434 u0438 u0442 u0442 u0441 u00a0的内容范围是50至80 mas。%,而 u043a u0440 u0435 u043c u043d u0438 u00a0的范围从20到50 mas。%。;15。用于p.11的系统,其中 u0430 u043b u044e u043c u0438 u043d u043d u0438 u00a0 u043d u0430 u0445 u043e u0434 u0438 u0442 u0442 u0441 u00a0的内容范围为60至70 mas。%,而 u043a u0440 u0435 u043c u043d u0438 u00a0的范围从30到40 mas。%。;16。 p.11的系统,其中 u0430 u043b u044e u043c u0438 u043d u0438 u00a0 u043d u0430 u0445 u043e u0434 u0438 u0442 u0442 u0442 u043e u0434 100 mass。%, u043a u0440 u0435 u043c u043d u0438 u00a0的范围为0到65 mas。%。;17。 p.11的系统,其中铝和硅选自其混合物或合金。18。 p.11的系统,其中目标还包含至少一个选自铬的 u043f u0440 u0438 u0441 u0430 u0434 u043a u0443, u0433 u0430 u0444 u043d u0438 u00a0, u0438 u0442 u0442 u0440 u0438 u00a0, u043d u0438 u043a u0435 u043b u00a0,硼,磷,钛, u0446 u0438 u0440 u043a u043e u043d u043d u00438 u00a0,t u0430 u043d u0442 u0430 u043b u0430, u043d u0438 u043e u0431 u0438 u00a0及其混合物或组合。; 19。阴极 u00a0 u0432 u043b u00a0 u0435 u0442 u0441 u00a0 p.11的系统,圆柱 u043c u0430 u0433 u043d u043d u0435 u0442 u0440 u04340 u043e u043d u043d u043d u043e u0439目标; 20。 p.11的系统,其中 u00a0 u0432 u043b u00a0 u0435 u0442 u0441 u00a0磁控管型圆柱形阴极靶。; 21。用于p.11的系统,其中 u00a0 u0432 u043b u00a0 u0435 u0442 u0441 u00a0带有阴极的扁平阴极。; 22。系统,其中阴极 u00a0 u0432 u043b u00a0 u0435 u0442 u0441 u00a0第11页,带有扁平阴极。系统进一步 u0441 u043e u0434 u0435 u0440 u0436 u0430 u0449 u0430 u00a0 p.11,等离子 u0438 u0437 u043b u0443 u0447 u0435 u043d u043d u0438 u00a0光学监控系统。 ; 24。系统 u044d u043b u0435 u043a u0442 u0440 u043e u043f u0438 u0442 u0430 u043d u0438 u00a0 p.11,其中交流电源包括用于自动 u0443 u043f u0440 u0430 u0432 u043b u0435 u043d u0438 u00a0反转 u0441 u0432 u00a0 u0437 u044c u044e在 u043d u0430 u043f u0440 u00a0 u0436 u0435 u043d u0438上。 25。 p.11的系统,其中阴极为 u0434 u043b u00a0 u0438 u0441 u043f u043e u043b u044c u0437 u043e u0432 u0430 u043d u0438 u00a0 50至500千瓦; 26。 p.11的系统,其中阴极为 u0434 u043b u00a0 u0438 u0441 u043f u043e u043b u044c u0437 u043e u0432 u0430 u043d u0438 u00a0从10到100赫兹; 27。 p.11的系统,其中阴极为 u0434 u043b u00a0 u0438 u0441 u043f u043e u043b u044c u0437 u043e u0432 u0430 u043d u0438 u00a0 30至70 khz; 28。系统进一步 u0441 u043e u0434 u0435 u0440 u0436 u0430 u0449 u0430 u00a0 p.11,至少一种选自氩气,氧气,氮气, u043d u0438 u0442 u0442 u0440 u043e u043a u0441 u0438 u0434 u0430及其混合物或组合。; 29。系统进一步 u0441 u043e u0434 u0435 u0440 u0436 u0430 u0449 u0430 u00a0 p.11,氩气和至少一种选自氧气,氮气,氖气的气体, u0433 u0435 u043b u0438 u00a0, u043d u0438 u0442 u0440 u043e u043a u0441 u0438 u0434 u0430,臭氧及其混合物或组合。; 30。目标 u0434 u043b u00a0等离子体 u0440 u0430 u0441 u043f u044b u043b u0435 u043d u0438 u00a0, u0441 u043e u0434 u0435 u0435 u0440 u0436 u0430 u0449 u0430 u0430铝在5到100 mass。%的范围内,硅在0到95 mass。%的范围内; 31。第30页上的目标 u0434 u043b u00a0血浆 u0440 u0430 u0441 u043f u044b u043b u0435 u043d u0438 u00a0,其中 u0430 u043b u044e u043c u0438 u043d u0438 u00a0 u043d u0430 u0445 u043e u0434 u0438 u0442 u0441 u00a0的范围从35到100 mas。%和 u043a u0440 u0435 u043c u043d u043d u0438 u00a0的范围是从0到65 mas。%.; 32。第30页的目标 u0434 u043b u00a0血浆 u0440 u0430 u0441 u043f u044b u043b u0435 u043d u0438 u00a0,其中 u0430 u043b u044e u043c u0438 u043d u0438 u00a0 u043d u0430 u0445 u043e u0434 u0438 u0442 u0441 u00a0的内容范围为40到90 mas。%和 u043a u0440 u0435 u043c u043d u0438 u00a0,范围从10到60 mas。%。;33。第30页上的目标 u0434 u043b u00a0血浆 u0440 u0430 u0441 u043f u044b u043b u0435 u043d u0438 u00a0,其中 u0430 u043b u044e u043c u0438 u043d u0438 u00a0 u043d u0430 u0445 u043e u0434 u0438 u0442 u0441 u00a0从50到80 mas。%和 u043a u0440 u0435 u043c u043d u043d u0438 u00a0从20到20 50 mas。%.; 34。第30页上的目标 u0434 u043b u00a0血浆 u0440 u0430 u0441 u043f u044b u043b u0435 u043d u0438 u00a0,其中 u0430 u043b u044e u043c u0438 u043d u0438 u00a0 u043d u0430 u0445 u043e u0434 u0438 u0442 u0441 u00a0从60到70 mas。%和 u043a u0440 u0435 u043c u043d u043d u0438 u00a0从30到40 mas。%.; 35。 p.30上的靶 u0434 u043b u00a0等离子体 u0440 u0430 u0441 u043f u044b u043b u0435 u043d u0438 u00a0,其中铝和硅选自其混合物或合金。36。第30页的目标 u0434 u043b u00a0血浆 u0440 u0430 u0441 u043f u044b u043b u0435 u043d u0438 u00a0,其中目标另外包含至少一个 u043f u0440 u0438 u0441 从铬中选择的u0430 u0434 u043a u0443, u0433 u0430 u0444 u043d u0438 u00a0, u0438 u0442 u0442 u0440 u0440 u0438 u00a0, u043d u0438 u043a u0435 u043b u00a0 bora,s u043e u0441 u0444 u043e u0440 u0430,钛,钽, u0446 u0438 u0440 u043a u043e u043e u043d u0438 u00a0, u043d u0438 u043e u0431 u0438 u00a0和它们的混合物或组合。

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