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A method for the production of micro-electromechanical systems (microelectromechanical systems: mems) by means of silicon fusion bonding - high temperature -

机译:一种通过硅熔融键合生产微机电系统(微机电系统:mems)的方法-高温-

摘要

A method for manufacturing microelectromechanical sensors (mems), in which the sensors, and the sensor signal processing electronics be executed monolithically integrated, in that a cavities containing first silicon wafer (cavities disk) with a second component wafer by bonding and then is thinned, characterized by the following procedure:– Use of a component wafer with a the subsequent components supporting high-impedance epitaxial layer that the same conductivity type as the cavities and disk has already structures of electronic circuits on the side which faces according to the connection of the cavity is.– High temperature - fusion bonding of the component wafer with the side of the epitaxial layer as a connection side to the cavities disc without a different type of intermediate layer between the two disks.– Thinning of the disks dressing on the side of the component wafer to the full elimination of the not by the epitaxial layer portion is formed of this disc, i.e, up to the the micromechanical part of the sensor or thickness of any other appropriate thickness of the membrane to a mechanical stress sensitive part of the epitaxial layer by means of mechanical abrasion..
机译:一种用于微机电传感器(mems)的制造方法,其中传感器和传感器信号处理电子器件整体地集成在一起,其中通过粘接将包含第一硅晶片(空腔盘)和第二成分晶片的空腔通过粘合然后减薄,其特征在于以下步骤:–使用带有支持高阻抗外延层的后续元件的元件晶圆,该元件具有与空腔和磁盘相同的导电类型,并且根据其连接方式在面向侧面的电子电路结构-高温-元件晶片与外延层的一侧作为空腔圆盘的连接面的熔融键合,而两个圆盘之间没有不同类型的中间层。由该盘形成直至不由外延层部分完全消除的成分晶片。传感器的机械机械部分或通过机械磨蚀使外延层的机械应力敏感部分的膜的任何其他合适厚度的厚度。

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