Semiconductor component - - - test method, in particular for a system with a plurality of in each case a data - intermediate memory - component modules having, as well as test - module for use in such a method

摘要

The present invention relates to a semiconductor component - - - test method for a system with a plurality of in each case at least one memory device (2a, 2b) with a buffer (10a, 10b) and a memory device - modules (12a, 12b), wherein for testing a test - module (12c) is used, which has a buffer (10c), but not a the memory components (2a, 2b) of the memory device - modules (12a, 12b) corresponding memory device (2a, 2b) comprises.Furthermore, the invention relates to a test - module (12c) for use in such a method, in particular a test - module (12c), which has a buffer (10c), but not a the memory components (2a, 2b) of the memory device - modules (12a, 12b) corresponding memory device (2a, 2b) comprises.