Integrated digital semiconductor components testing system e.g. for semiconductor memories, has built outside self-test module that adjusts to time requirement of semiconductor to be tested

摘要

A built outside self-test (BOST) module (10) is connected between standard test device and device under test (DUT). The BOST module multiplies frequencies of test and control signals generated by the test apparatus and provides the signals to the semiconductor to be tested. The BOST module adjusts to the time conditions of the semiconductor to be tested from which it receives result signals. An Independent claim is also included for semiconductor test circuit.