Semiconductor component - - - test device, in particular data - intermediate memory - component with semiconductor component - - - test device, as well as semiconductors - component - test - the method

摘要

The present invention relates to a semiconductor component test - - - method and a semiconductor component - - - test means (10b), comprising:- a device (43) for generating to corresponding address - inputs of a semiconductor - component to be tested (2b), in particular memory component is to be applied, pseudo random address values - - -.