首页> 外国专利> Deposition of single layers, on a flat or structured substrate, uses a limiter to stop the deposition automatically when the layer is closed

Deposition of single layers, on a flat or structured substrate, uses a limiter to stop the deposition automatically when the layer is closed

机译:在平坦或结构化的基板上进行单层沉积时,使用限制器可在层关闭时自动停止沉积

摘要

The process to deposit at least one layer on to a substrate, containing at least one initial component, uses a process chamber where there is a cyclic and alternating action between two start materials where the first start material contains the first component. The start material is a gas, fed into the process chamber so that in each cycle only one layer is deposited of the first component. A limiter is introduced into the process chamber together with the first start material, or at an offset time, so that the deposition of the first component on the substrate ends automatically when the first layer is closed. The growth of a second layer is possible when the cycle ends. The layers are deposited on a substrate with a flat or structured surface using components of metal, oxygen, nitrogen or carbon. The start material contains ruthenium, and the limiter is octane or iso octane or a hydrocarbon.
机译:在包含至少一个初始成分的衬底上沉积至少一层的方法是使用处理腔室,在该处理腔室中两种起始材料之间具有循环交替作用,其中第一起始材料包含第一成分。起始原料是气体,其被送入处理室,使得在每个循环中仅沉积第一组分的一层。将限制剂与第一起始材料一起或在偏移时间处引入到处理室中,以使得当第一层闭合时第一组分在基板上的沉积自动结束。当循环结束时,第二层的生长是可能的。使用金属,氧,氮或碳的组分将这些层沉积在具有平坦或结构化表面的基底上。起始材料包含钌,限制剂是辛烷或异辛烷或烃。

著录项

  • 公开/公告号DE102004061094A1

    专利类型

  • 公开/公告日2006-06-22

    原文格式PDF

  • 申请/专利权人 AIXTRON AG;

    申请/专利号DE20041061094

  • 申请日2004-12-18

  • 分类号C23C16/455;C23C16/448;C23C16/52;

  • 国家 DE

  • 入库时间 2022-08-21 21:20:32

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