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speicherredundanzschaltung, single polysilicon used as redundanzelemente - schwebegattertransistoren

机译:存储器冗余电路,单个多晶硅用作冗余元件-浮栅晶体管

摘要

A read-only memory device (10) is provided which comprises an array of read-only memory cells arranged in rows and columns. An additional row (15) of flat, single polysilicon floating gate memory cells is provided. A row decoder (11) coupled to the array of read-only memory cells is responsive to addresses corresponding to rows in the array for selecting addressed rows. Control circuitry (18) including a programmable store for identifying a defective row in the array to be replaced by the additional row, selects the additional row and replaces the defective row in response to an address corresponding to the defective row. In addition, circuitry (19) is provided on the integrated circuit which allows access to the additional row of floating gate memory cells for programming the additional row. This structure is particularly applied to an array of mask ROM cells.
机译:提供了一种只读存储设备(10),其包括以行和列布置的只读存储单元的阵列。提供了另外的平坦的单多晶硅浮栅存储单元的行(15)。耦合到只读存储单元阵列的行解码器(11)响应于与阵列中的行相对应的地址,以选择寻址的行。控制电路(18)包括可编程存储器,用于识别阵列中的缺陷行,该缺陷行将被附加行替换,选择附加行并响应于与缺陷行相对应的地址来替换缺陷行。另外,在集成电路上提供电路(19),该电路允许访问浮栅存储单元的附加行以对附加行进行编程。该结构特别适用于掩模ROM单元的阵列。

著录项

  • 公开/公告号DE69635842D1

    专利类型

  • 公开/公告日2006-04-27

    原文格式PDF

  • 申请/专利权人 MACRONIX INTERNATIONAL CO. LTD. HSINCHU;

    申请/专利号DE19966035842T

  • 发明设计人 YIU DANG-HSING;SHONE FUCHIA;

    申请日1996-10-28

  • 分类号H01L21/8247;H01L29/76;G11C7;G11C11/34;G11C17;G11C29;G11C29/04;H01L21/82;H01L27/10;H01L27/115;H01L29/788;H01L29/792;H01L29/94;H01L31/062;

  • 国家 DE

  • 入库时间 2022-08-21 21:18:07

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