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APPARATUS FOR MAGNETRON SPUTTER FILM DEPOSITION, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

机译:磁控溅射膜沉积的装置以及制造半导体器件的方法

摘要

PROBLEM TO BE SOLVED: To provide a technology capable of depositing a ferroelectric film having excellent crystallinity even when performing sputtering by a target with advanced erosion, and enhancing a yield.;SOLUTION: A magnetron sputter film deposition apparatus comprises an evacuated film deposition chamber 11, an electrostatic chuck means 12 capable of adjusting the temperature of a substrate 14 to be treated, a target 15 for performing the high frequency magnetron sputtering of the substrate 14, a gas feed means 11a for feeding a discharge gas to the evacuated film deposition chamber 11, a power supply means 17 which applies the discharge voltage between the substrate 14 and the target 15 and measures the integral power consumption L1 (kWh) of electricity discharged by the target 15, and a control means 18 for controlling the electrostatic chuck means 12 and the power supply means 17. The optimum temperature of the substrate 14 for the sputtering is calculated on the basis of the integral power consumption of the electricity discharged by the target 15, and the sputtering is performed after adjusting the temperature of the substrate 14 at a predetermined value.;COPYRIGHT: (C)2008,JPO&INPIT
机译:解决的问题:提供一种即使在通过具有强腐蚀的靶材进行溅射时也能够沉积具有优异结晶度的铁电膜并提高产率的技术;解决方案:磁控溅射膜沉积装置包括真空膜沉积室11静电吸盘装置12,其能够调节待处理基板14的温度;靶15,其用于对基板14进行高频磁控溅射;气体供给装置11a,其用于将排出气体供给至真空成膜室。参照图11,电源装置17在基板14和靶材15之间施加放电电压,并测量由靶材15释放的电的总功耗L1(kWh),控制装置18用于控制静电吸盘装置12以及电源装置17。基于该温度计算出用于溅射的基板14的最佳温度。靶材15释放的电能的总功耗,以及在将基板14的温度调节到预定值之后执行溅射。版权所有:(C)2008,JPO&INPIT

著录项

  • 公开/公告号JP2007262473A

    专利类型

  • 公开/公告日2007-10-11

    原文格式PDF

  • 申请/专利权人 FUJITSU LTD;

    申请/专利号JP20060087957

  • 发明设计人 O FUMIO;

    申请日2006-03-28

  • 分类号C23C14/34;H01L21/31;H01L21/8246;H01L27/105;H01L27/10;H01L21/316;

  • 国家 JP

  • 入库时间 2022-08-21 21:16:20

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