首页> 外国专利> METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND METHOD OF ADJUSTING CURRENT AMPLIFICATION FACTOR OF BIPOLAR TRANSISTOR WITH EMITTER POLYSILICON ELECTRODE STRUCTURE

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND METHOD OF ADJUSTING CURRENT AMPLIFICATION FACTOR OF BIPOLAR TRANSISTOR WITH EMITTER POLYSILICON ELECTRODE STRUCTURE

机译:发射极多晶硅电极结构的半导体器件制造方法和调节双极晶体管的电流放大系数的方法

摘要

PROBLEM TO BE SOLVED: To cope with both the cost reduction and the high frequency response characteristics of a longitudinal NPN bipolar transistor having a polysilicon emitter electrode structure, by controlling the current amplification factor of the transistor without adding any process.;SOLUTION: On forming an emitter polysilicon 190 at low temperatures (400°C), an interfacial oxide film (natural oxide film) grows between an intrinsic base 140 and the emitter 190. Then the heat treating temperature for forming an emitter 150 is adjusted in a range of 820-910°C to control the interfacial oxide film condition and the pile up condition of electrons, thus finely adjusting the current amplification factor.;COPYRIGHT: (C)2008,JPO&INPIT
机译:解决的问题:通过控制晶体管的电流放大系数而不增加任何工艺,以解决成本降低和具有多晶硅发射极结构的纵向NPN双极晶体管的高频响应特性的问题。在低温(400℃)下的发射极多晶硅190中,界面氧化膜(天然氧化膜)在本征基极140和发射极190之间生长。然后将用于形成发射极150的热处理温度调节在820的范围内。 -910°C控制界面氧化膜的状态和电子的堆积状态,从而精细地调节电流放大系数。;版权所有:(C)2008,JPO&INPIT

著录项

  • 公开/公告号JP2007281096A

    专利类型

  • 公开/公告日2007-10-25

    原文格式PDF

  • 申请/专利权人 MATSUSHITA ELECTRIC IND CO LTD;

    申请/专利号JP20060103494

  • 发明设计人 KOBAYASHI NOBUYOSHI;

    申请日2006-04-04

  • 分类号H01L21/331;H01L29/732;

  • 国家 JP

  • 入库时间 2022-08-21 21:15:36

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