CHARGED PARTICULATE SAMPLING DEVICE, AND CHARGED AMOUNT DISTRIBUTION MEASURING DEVICE

摘要

PROBLEM TO BE SOLVED: To provide a charged particulate sampling device for suppressing variation in charged amount of charged particulates in a sampling process of introducing the charged particulates into a measuring device for measuring the charged state of the particulates.;SOLUTION: The sampling device 200 comprises a slit 201, an upper opening 202, FPCs 21A and 21B, and a voltage impression device 300. The slit 201 is arranged so as to face a charged particulate inlet 108 formed in the measuring device 100. The upper opening 202 receives a toner group 400. The FPCs 21A and 21B have a guide face for guiding the toner group introduced inside via the upper opening 202 to the slit 201. The voltage impression device 300 impresses alternating voltage to a plurality of electrode groups formed in the FPCs 21A and 21B, and forms an electric field curtain near the guide face.;COPYRIGHT: (C)2007,JPO&INPIT