FAILURE LIST AND TEST PATTERN PREPARATION DEVICE, FAILURE LIST AND TEST PATTERN PREPARATION METHOD, FAILURE LIST PREPARATION AND FAILURE DETECTION RATE CALCULATION DEVICE, AND FAILURE LIST PREPARATION AND FAILURE DETECTION RATE CALCULATION METHOD

摘要

PPROBLEM TO BE SOLVED: To provide a test pattern preparation device, a test pattern preparation method, a failure detection rate calculation device, and a failure detection rate calculation method for preparing a test pattern for highly precisely detecting the bridge failure of an LSI. PSOLUTION: A failure list and test pattern preparation device is provided with: a short circuit information preparation module 11 for preparing short circuit information showing a relationship between the logical value of the input signal of a cell and the potential of a short-circuited place assumed at the output terminal of the cell; a threshold information preparation module 12 for preparing logical threshold information by calculating the logical threshold of the input terminal of the cell; an extraction module 13 for extracting bridge failure information from layout information of the LSI; a failure list preparation module 14 for preparing a bridge failure list including bridge failure types by using the bridge failure information, the short circuit information and the logical threshold information; and a test module 15 for preparing a test pattern for detecting bridge failures in adjacent wiring pairs and by failure types by using the bridge failure test. PCOPYRIGHT: (C)2007,JPO&INPIT