Test pattern creation and failure detection rate calculation apparatus, test pattern creation and failure detection rate calculation method

摘要

PROBLEM TO BE SOLVED: To improve the quality of testing by generating a test pattern which detects bridge failures of LSI, with high accuracy.;SOLUTION: A failure detection rate calculation device includes a bridge failure potential calculation part for generating bridge failure potential information indicating the relation of an input logic value of a cell and potential on a bridge presumed on an output terminal; a logic threshold calculating part 102 for calculating the logic threshold of an input terminal; a bridge failure information extracting part 104 for extracting bridge failure information; a detection limit resistance value calculating part 103 for generating enlargement bridge failure potential information, by calculating the detection limit resistance value of each bridge failure; a bridge failure list generating part 105 for generating a bridge failure list; a test pattern generating part 106 for generating the test pattern and failure detection information, based on the bridge failure list; and a failure detection rate calculating part 107 for calculating weighted failure detection rate and a bridge remaining rate, or the like, based on failure detection information and bridge failure occurrence information.;COPYRIGHT: (C)2009,JPO&INPIT